Analysis of a new three-dimensional jerk chaotic system with transient chaos and its adaptive backstepping synchronous control

IF 2.2 3区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Integration-The Vlsi Journal Pub Date : 2024-05-24 DOI:10.1016/j.vlsi.2024.102210

Shaohui Yan , Jianjian Wang , Lin Li

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Abstract

A new three-dimensional Jerk chaotic system with line equilibrium points is proposed. The system is researched in detail by the Lyapunov exponent graph, bifurcation diagram, phase diagram, and time domain waveform diagram, which show that the system has rich dynamical behaviors, such as eight types of coexisting attractors, extreme multistability of four different attractor states, and offset boosting in two directions. In addition, the system also has six types of transient chaos, which greatly increase the complexity of the system. We study the variation of the spectral entropy (SE) and C0 complexity when the system takes different initial values. Also, in this paper, the initial conditions under which the system is in a synchronized state are determined by initial values with higher complexity. The correctness of the theoretical analysis and numerical simulation is verified by circuit simulation and hardware experiments. Finally, the new system achieves synchronization control utilizing a designed adaptive backstepping controller, laying the foundation for its subsequent use in secure communications.

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带有瞬态混沌的新型三维 Jerk 混沌系统及其自适应反步进同步控制分析

提出了一种新的三维 Jerk 混沌系统，该系统具有线平衡点。通过Lyapunov指数图、分岔图、相位图和时域波形图对该系统进行了详细研究，结果表明该系统具有丰富的动力学行为，如八种共存吸引子、四种不同吸引子状态的极端多稳态性和两个方向的偏移提升。此外，系统还存在六种瞬态混沌，大大增加了系统的复杂性。我们研究了系统取不同初始值时的谱熵 (SE) 和 C0 复杂性的变化。同时，在本文中，系统处于同步状态的初始条件是由复杂度较高的初始值决定的。电路仿真和硬件实验验证了理论分析和数值模拟的正确性。最后，新系统利用设计的自适应反步进控制器实现了同步控制，为其后续在安全通信中的应用奠定了基础。

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来源期刊

Integration-The Vlsi Journal 工程技术-工程：电子与电气

CiteScore

3.80

自引率

5.30%

发文量

107

审稿时长

6 months

期刊介绍： Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.