A Prescan Method to Accelerate Near-Field Scan Immunity Tests

Abstract

Near-field scan immunity (NFSI) is a powerful measurement method to diagnose susceptibility issues at printed-circuit board (PCB) and integrated-circuit (IC) levels. However, one limitation of this approach is the excessive measurement time required to build the susceptibility maps, which reveal the sensitive pins or traces of the device under test (DUT). This letter presents a prescan method based on a large-band injection in order to determine rapidly the more relevant scanning positions, the frequency range of interests, and an estimation of the susceptibility level on each scanning position. The prescan provides the configuration parameters of the full NFSI scan in order to keep an acceptable test duration.