Martin Müller, Maren Dworschak, Jan Benedikt, Lorenz Kienle
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引用次数: 0
Abstract
The atmospheric pressure plasma source HelixJet has been used to generate tungsten nanocrystals with narrow size distributions, well defined size control and with a considerably good particle yield. Tungsten particles are produced as the result of an evaporation process of a tungsten wire inserted on the middle axis of the jet after the wire is heated by interaction with the plasma. Temperature measurements using a thermocouple and by optical emission spectroscopy showed that, while the overall temperature of the wire is very high, it is not in the range of the melting temperature of tungsten; however, it can reach values needed for sublimation. Additionally, the wire is heated selectively while the temperature of the jet components reaches only a few hundred degrees Celsius. The particles cluster into agglomerates and their formation has been analyzed in relation to the reliability of a commercial scanning mobility particle sizer spectrometer. The dependence of the particle morphology and crystal structure on the plasma parameters such as power and gas flow was studied via transmission electron microscopy and the average size of the tungsten nanocrystals could be tuned between 12 and 25 nm.
期刊介绍:
Particle & Particle Systems Characterization is an international, peer-reviewed, interdisciplinary journal focusing on all aspects of particle research. The journal joined the Advanced Materials family of journals in 2013. Particle has an impact factor of 4.194 (2018 Journal Impact Factor, Journal Citation Reports (Clarivate Analytics, 2019)).
Topics covered include the synthesis, characterization, and application of particles in a variety of systems and devices.
Particle covers nanotubes, fullerenes, micelles and alloy clusters, organic and inorganic materials, polymers, quantum dots, 2D materials, proteins, and other molecular biological systems.
Particle Systems include those in biomedicine, catalysis, energy-storage materials, environmental science, micro/nano-electromechanical systems, micro/nano-fluidics, molecular electronics, photonics, sensing, and others.
Characterization methods include microscopy, spectroscopy, electrochemical, diffraction, magnetic, and scattering techniques.