Design dependence of noise in Nb-based dc SQUIDs

V. Zakosarenko, M. Schmelz, Jurgen Kunert, Evgeni Il'ichev, R. Stolz
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Abstract

Noise in superconducting quantum interference devices (dc SQUIDs) with different design, based on Nb/AlOx/Nb technology, has been systematically measured at temperature T = 4.2 K. We demonstrate that for all our devices the power spectral density of the white noise (above a frequency of about 1 kHz) is determined by the shunt resistors, reaching about 5 times Planck’s constant. The low-frequency noise level was measured for washer- and multi-loop-type SQUIDs with systematically varied effective area, SQUID loop perimeter, and inductance. We show that at 1 Hz the noise spectral density is approximately 40 times higher than the white noise level and its scaling with washer width and effective area is negligible. These results are incompatible with several models of the flicker noise source. Possible origins of this noise are discussed.
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铌基直流 SQUID 噪声的设计依赖性
我们在温度 T = 4.2 K 的条件下对基于铌/氧化铝/铌技术的不同设计的超导量子干涉装置(直流 SQUID)中的噪声进行了系统测量。我们证明,对于我们的所有装置,白噪声(频率高于约 1 kHz)的功率谱密度由分流电阻决定,约为普朗克常数的 5 倍。我们测量了有效面积、SQUID 回路周长和电感量系统变化的洗碗机型和多回路型 SQUID 的低频噪声水平。我们的研究表明,在 1 Hz 时,噪声频谱密度比白噪声水平高出约 40 倍,而且其与垫圈宽度和有效面积的比例关系可以忽略不计。这些结果与若干闪烁噪声源模型不符。本文讨论了这种噪声的可能来源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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