Ultra-Transparent Cerium-Doped Indium Oxide Films Deposited with Industry-Scale Reactive Plasma Deposition

IF 2.5 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-06-06 DOI:10.1007/s11664-024-11198-3
Sicheng Wan, Xiaohua Man, Ping Zhang, Yao Chen, Jinxing He, Zhiyang Luo, Xiaoqing Hu, Yunfei Hu
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Abstract

Transparent conductive oxide (TCO) films are widely used as electrodes in photovoltaic devices, such as perovskite solar cells and heterojunction solar cells. However, in the conventional physical vapor deposition process, there may be ion bombardment damage to the underlayer coatings, and high deposition temperature also have an adverse effect on perovskite and amorphous silicon layers during TCO deposition. Herein, reactive plasma deposition was effectively utilized for cerium-doped indium oxide (ICO) film as an ultra-transparent electrode. The effects of plasma gun current and the oxygen ratio on the optical and electrical properties, and also on the structure of the ICO films, were investigated. With an industry-scale reactive plasma deposition tool, an outcome of 140-nm ICO film can be achieved within 50 s, which represents a good throughput with the average growth rate of 2.8 nm/s. When the working current was 165 A and the oxygen ratio was 12%, the average transmittance of ICO films reached the highest value (93.09%) in the wavelength range of 400–1200 nm. The average transmittance in the visible wavelength range was 94.23%. The peak transmittance was up to 99.67% at 515 nm, and the corresponding resistivity was 4.68 × 10−4 Ω cm.

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利用工业级反应等离子体沉积技术沉积的超透明掺铈氧化铟薄膜
透明导电氧化物(TCO)薄膜作为电极广泛应用于钙钛矿太阳能电池和异质结太阳能电池等光伏器件中。然而,在传统的物理气相沉积工艺中,可能存在离子轰击损伤下层涂层,并且在TCO沉积过程中,较高的沉积温度也会对钙钛矿层和非晶硅层产生不利影响。本文将反应等离子沉积技术有效地应用于掺铈氧化铟(ICO)薄膜的超透明电极制备。研究了等离子体电流和氧比对ICO薄膜的光学和电学性能以及结构的影响。利用工业规模的反应等离子体沉积工具,可以在50秒内获得140 nm的ICO膜,平均生长速度为2.8 nm/s,具有良好的吞吐量。当工作电流为165 A,氧比为12%时,ICO膜的平均透过率在400 ~ 1200 nm波长范围内达到最高值(93.09%)。可见光范围内的平均透过率为94.23%。在515 nm处透射率达到99.67%,电阻率为4.68 × 10−4 Ω cm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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