The Effect of TiO2 Nanoparticle Doping on the Structural and Optical Properties of Coal Fly Ash Thin Films

IF 2.5 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-06-05 DOI:10.1007/s11664-024-11205-7

Rawan Aljabbari, Thamer Alomayri, Faisal G. AL-Maqate, Abeer AlSuwat

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Abstract

This study has investigated the impact of TiO₂ doping on the structural and optical characteristics of fly ash thin films. The thin films were produced using the spin-coating technique, and the structural investigation was conducted using XRD and SEM techniques to evaluate the crystallinity of the samples and to calculate related structural parameters, including crystallite size, which was found to be influenced by the TiO₂ content. Additionally, SEM images of the thin film surfaces indicated a denser structure characterized by a reduced quantity of pores in the thin films containing TiO₂. Furthermore, the introduction of TiO₂ as a dopant resulted in a reduction of the optical band gap energy of the films from 3.956 eV to 3.900 eV. Also, the doping led to an increased refractive index and extinction coefficient. Moreover, it notably enhanced the optical conductivity, which reached \(4.61\times {10}^{13 }{S}^{-1}\). The enhanced optical characteristics of the thin films render them to be appropriate for a wide range of photovoltaic applications.

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掺杂 TiO2 纳米粒子对粉煤灰薄膜结构和光学特性的影响

本研究考察了TiO2掺杂对粉煤灰薄膜结构和光学特性的影响。采用旋涂技术制备薄膜，利用XRD和SEM技术进行结构研究，评价样品的结晶度，并计算相关结构参数，包括晶粒尺寸，发现晶粒尺寸受TiO2含量的影响。此外，薄膜表面的SEM图像表明，含有TiO2的薄膜中孔隙数量减少，结构更致密。此外，TiO2作为掺杂剂的引入使薄膜的光学带隙能量从3.956 eV降低到3.900 eV。此外，掺杂导致折射率和消光系数增加。此外，它显著提高了光学导电性，达到\(4.61\times {10}^{13 }{S}^{-1}\)。薄膜的增强光学特性使它们适合于广泛的光伏应用。

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来源期刊

Journal of Electronic Materials 工程技术-材料科学：综合

CiteScore

4.10

自引率

4.80%

发文量

693

审稿时长

3.8 months

期刊介绍： The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.