Improvement of p-type ohmic contact of GaN laser diodes by using delta-doped p-GaN contact layer

IF 2.7 Q2 PHYSICS, CONDENSED MATTER Micro and Nanostructures Pub Date : 2024-06-04 DOI:10.1016/j.micrna.2024.207899
Rui Lang , Menglai Lei , Shukun Li , Huanqing Chen , Hua Zong , Shengxiang Jiang , Guo Yu , Weihua Chen , Xiaodong Hu
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Abstract

The p-type ohmic contact of GaN laser diodes has been optimized in several ways. The heavily doped p-GaN contact layer obtained by using delta-doping method, which effectively suppressed the self compensation effect of Mg ions during the heavy doping. By optimizing the delta-doping period, temperature, and thickness of the p-GaN contact layer, the activation energy of Mg atoms is reduced, and the hole concentration in the surface contact layer is further increased. Finally, the specific contact resistivity of the p-type ohmic contact of the GaN laser, measured more accurately by using the transmission line module, was successfully reduced to the order of 1E-3 Ω cm2.

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使用三角掺杂的 p-GaN 接触层改善 GaN 激光二极管的 p 型欧姆触点
GaN 激光二极管的对型欧姆接触已通过多种方法进行了优化。采用三角掺杂法获得的重掺杂 p-GaN 接触层,有效抑制了重掺杂过程中镁离子的自补偿效应。通过优化 p-GaN 接触层的△掺杂周期、温度和厚度,降低了镁原子的活化能,进一步提高了表面接触层中的空穴浓度。最后,利用传输线模块更精确地测量了氮化镓激光器 p 型欧姆接触的比接触电阻率,成功地将其降低到 1E-3 Ω cm2 的数量级。
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