Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system.

IF 2.6 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY Beilstein Journal of Nanotechnology Pub Date : 2024-06-17 eCollection Date: 2024-01-01 DOI:10.3762/bjnano.15.57
Wendong Sun, Jianqiang Qian, Yingzi Li, Yanan Chen, Zhipeng Dou, Rui Lin, Peng Cheng, Xiaodong Gao, Quan Yuan, Yifan Hu
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Abstract

Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of cantilevers to achieve rapid high-resolution imaging and extract multiple properties. However, the higher-order modal response of traditional rectangular cantilever is weaker in air, which affects the sensitivity of multifrequency AFM detection. To address this issue, we previously proposed a bridge/cantilever coupled system model to enhance the higher-order modal response of the cantilever. This model is simpler and less costly than other enhancement methods, making it easier to be widely used. However, previous studies were limited to theoretical analysis and preliminary simulations regarding ideal conditions. In this paper, we undertake a more comprehensive investigation of the coupled system, taking into account the influence of probe and excitation surface sizes on the modal response. To facilitate the exploration of the effectiveness and optimal conditions for the coupled system in practical applications, a macroscale experimental platform is established. By conducting finite element analysis and experiments, we compare the performance of the coupled system with that of traditional cantilevers and quantify the enhancement in higher-order modal response. Also, the optimal conditions for the enhancement of macroscale cantilever modal response are explored. Additionally, we also supplement the characteristics of this model, including increasing the modal frequency of the original cantilever and generating additional resonance peaks, demonstrating the significant potential of the coupled system in various fields of AFM.

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利用耦合悬臂系统增强多频原子力显微镜的高阶模态响应。
多频原子力显微镜(AFM)利用悬臂的多模操作实现快速高分辨率成像并提取多种特性。然而,传统矩形悬臂在空气中的高阶模态响应较弱,影响了多频原子力显微镜检测的灵敏度。为解决这一问题,我们之前提出了一种桥/悬臂耦合系统模型,以增强悬臂的高阶模态响应。与其他增强方法相比,该模型更简单、成本更低,因此更容易得到广泛应用。然而,以往的研究仅限于理论分析和理想条件下的初步模拟。在本文中,我们对耦合系统进行了更全面的研究,考虑了探头和激励面尺寸对模态响应的影响。为了便于探索耦合系统在实际应用中的有效性和最佳条件,我们建立了一个宏观实验平台。通过进行有限元分析和实验,我们比较了耦合系统与传统悬臂的性能,并量化了高阶模态响应的增强效果。同时,我们还探索了增强宏观悬臂模态响应的最佳条件。此外,我们还对该模型的特性进行了补充,包括提高原始悬臂的模态频率和产生额外的共振峰,从而展示了耦合系统在原子力显微镜各个领域的巨大潜力。
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来源期刊
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology NANOSCIENCE & NANOTECHNOLOGY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.70
自引率
3.20%
发文量
109
审稿时长
2 months
期刊介绍: The Beilstein Journal of Nanotechnology is an international, peer-reviewed, Open Access journal. It provides a unique platform for rapid publication without any charges (free for author and reader) – Platinum Open Access. The content is freely accessible 365 days a year to any user worldwide. Articles are available online immediately upon publication and are publicly archived in all major repositories. In addition, it provides a platform for publishing thematic issues (theme-based collections of articles) on topical issues in nanoscience and nanotechnology. The journal is published and completely funded by the Beilstein-Institut, a non-profit foundation located in Frankfurt am Main, Germany. The editor-in-chief is Professor Thomas Schimmel – Karlsruhe Institute of Technology. He is supported by more than 20 associate editors who are responsible for a particular subject area within the scope of the journal.
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