Particle induced X-ray emission apparatus utilizing superconducting tunnel junction detector

IF 1.4 3区物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2024-07-01 DOI:10.1016/j.nimb.2024.165451

S. Shiki , G. Fujii , S. Tomita , K. Sasa

引用次数: 0

Abstract

Particle induced X-ray emission with the use of focused ion beam (µ-PIXE) utilizing a superconducting tunnel junction (STJ) X-ray spectrometer has been developed to realize light element mapping in the soft X-ray region. A five hundred pixels array of STJ detector has been installed in the µ-PIXE beamline at the accelerator facility in the University of Tsukuba. Performance of a single-pixel STJ detector is tested. The K-lines of light elements C to Al have been separately detected in the pulse height spectra with a broad background, which is attributed substrate-hit events caused by scattered protons and high-energy characteristic X-ray lines. The background is rejected by using the anticoincidence technique or rise-time discrimination.

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利用超导隧道结探测器的粒子诱导 X 射线发射装置

利用超导隧道结（STJ）X 射线光谱仪开发了使用聚焦离子束的粒子诱导 X 射线发射（µ-PIXE），以实现软 X 射线区域的光元素绘图。筑波大学加速器设施的 µ-PIXE 光束线安装了一个五百像素阵列的 STJ 探测器。测试了单像素 STJ 探测器的性能。在脉冲高度谱图中分别检测到了轻元素 C 至 Al 的 K 线和宽背景，这归因于由散射质子和高能特征 X 射线引起的基片撞击事件。使用反重合技术或上升时间判别法可以剔除背景。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms 物理-核科学技术

CiteScore

2.80

自引率

7.70%

发文量

231

审稿时长

1.9 months

期刊介绍： Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.