Yixiong Luo;Jianhua Shi;Jinbiao Tan;Zijie Ren;Jiafu Wan;Mejdl Safran;Salman A. AlQahtani
{"title":"An Ensemble Data-Model-Label Three-Level Regularization Framework for Imbalanced Intelligent Fault Diagnosis","authors":"Yixiong Luo;Jianhua Shi;Jinbiao Tan;Zijie Ren;Jiafu Wan;Mejdl Safran;Salman A. AlQahtani","doi":"10.1109/TR.2024.3415117","DOIUrl":null,"url":null,"abstract":"In real industrial scenarios, fault data are characterized by class imbalance, a major challenge for data-driven intelligent fault diagnosis. This article proposes a novel three-level regularization framework that integrates data, models, and labels to diagnose the imbalanced fault. First, a signal to image (S2I) module is introduced, which converts 1-D signals into 2-D images to conduct research and reduce model development workload and model-specific dependencies. Then, a regularization framework is proposed consisting of three submodules, inner local feature regularization (ILFR), outer local feature regularization (OLFR), and class balance margin loss (CBML), improving the faulty health state recognition accuracy without degrading the normal health state recognition performance. Finally, adequate experiments are carried out on four mechanical fault datasets. The results show that under the extremely imbalanced conditions, the proposed framework can improve the accuracy of the baseline method by 28%, 38%, and 25% on the three datasets (including PU, JNU, and UoC), respectively. Moreover, the proposed framework outperforms the SOTA method on the CWRU dataset, which validates the effectiveness and superiority of the proposed framework.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"3884-3896"},"PeriodicalIF":5.7000,"publicationDate":"2024-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10576060/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
In real industrial scenarios, fault data are characterized by class imbalance, a major challenge for data-driven intelligent fault diagnosis. This article proposes a novel three-level regularization framework that integrates data, models, and labels to diagnose the imbalanced fault. First, a signal to image (S2I) module is introduced, which converts 1-D signals into 2-D images to conduct research and reduce model development workload and model-specific dependencies. Then, a regularization framework is proposed consisting of three submodules, inner local feature regularization (ILFR), outer local feature regularization (OLFR), and class balance margin loss (CBML), improving the faulty health state recognition accuracy without degrading the normal health state recognition performance. Finally, adequate experiments are carried out on four mechanical fault datasets. The results show that under the extremely imbalanced conditions, the proposed framework can improve the accuracy of the baseline method by 28%, 38%, and 25% on the three datasets (including PU, JNU, and UoC), respectively. Moreover, the proposed framework outperforms the SOTA method on the CWRU dataset, which validates the effectiveness and superiority of the proposed framework.
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.