{"title":"IC Phone Home!","authors":"Scott Davidson","doi":"10.1109/mdat.2024.3393829","DOIUrl":null,"url":null,"abstract":"Many who have worked for vertically integrated companies making both ICs and computer equipment have experience in tracking ICs in the field. This is the subject of this issue of <italic xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\">IEEE Design&Test</i> on Silicon Lifecycle Management. If your company dealt with high-end equipment, where every failure mattered, you could close the loop on IC quality and see the failure rate of parts in use.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2024.3393829","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Many who have worked for vertically integrated companies making both ICs and computer equipment have experience in tracking ICs in the field. This is the subject of this issue of IEEE Design&Test on Silicon Lifecycle Management. If your company dealt with high-end equipment, where every failure mattered, you could close the loop on IC quality and see the failure rate of parts in use.
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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