Correlation Between Polarization Mechanisms and Material Characteristics in Thermally Aged 320-kV HVDC Cable Insulation

IF 2.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2024-07-11 DOI:10.1109/TDEI.2024.3426492
Darshan Prakash Borthakur;Alok Ranjan Verma
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Abstract

In the present work, degradation analysis associated with the thermal stress in a 320-kV cross-linked polyethylene (XLPE) insulated cable insulation has been carried out. Accelerated thermal aging at 140 °C for 30 days is done for XLPE insulation to understand the material degradation. Physicochemical analyses such as Fourier transform infrared (FTIR) Spectroscopy, differential scanning calorimetry (DSC), and X-ray diffraction (XRD) analyses have been performed to understand the material degradation due to thermal stress. These material investigations show interesting features regarding changes in characteristic peaks and formation of carbonyl group, microstructural changes, and decreased degree of crystallinity with thermal aging as evident by FTIR, XRD, and DSC, respectively. Measurements of polarization and depolarization current (PDC) have been carried out in the thermally aged insulation samples. It is observed that with thermal aging the polarization and depolarization current magnitude seem to increase. A novel technique employing relaxation frequency distribution (RFD) has been used to get a deeper insight into the thermal degradation of the material by understanding the relaxation mechanism of the dipoles with the thermal aging. RFD spectrum shows a dominant slow polarization as the material undergoes thermal aging. Higher dielectric loss with thermal aging of the samples has been observed from the RFD spectrum. This higher dielectric loss is also validated using dielectric dissipation factor ( $\tan \delta $ ) measurement. Moreover, a correlation between RFD spectrum and physicochemical analyses has been established.
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热老化 320 kV 高压直流电缆绝缘极化机制与材料特性之间的相关性
本文对320kv交联聚乙烯(XLPE)绝缘电缆绝缘层的热应力退化进行了分析。在140°C下进行30天的加速热老化,以了解XLPE绝缘材料的降解情况。通过傅里叶变换红外光谱(FTIR)、差示扫描量热法(DSC)和x射线衍射(XRD)等物理化学分析来了解由于热应力导致的材料降解。通过FTIR、XRD和DSC分别观察到这些材料的特征峰和羰基形成的变化、微观结构的变化以及结晶度随热老化的降低等有趣的特征。对热老化后的绝缘试样进行了极化和去极化电流(PDC)测量。观察到,随着热老化,极化电流和去极化电流都增大。利用弛豫频率分布(RFD)技术对材料热老化过程中偶极子的弛豫机制进行了深入研究。RFD光谱显示材料在热老化过程中以慢极化为主。从RFD光谱中观察到,随着热老化,样品的介电损耗增大。使用介电损耗因子($\tan \delta $)测量也验证了这种较高的介电损耗。此外,还建立了RFD光谱与理化分析之间的相关性。
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
期刊最新文献
2024 Index IEEE Transactions on Dielectrics and Electrical Insulation Vol. 31 Table of Contents Editorial Condition Monitoring and Diagnostics of Electrical Insulation IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors IEEE Transactions on Dielectrics and Electrical Insulation Publication Information
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