Pub Date : 2026-01-06DOI: 10.1109/TDEI.2026.3651211
{"title":"2025 Index IEEE Transactions on Dielectrics and Electrical Insulation","authors":"","doi":"10.1109/TDEI.2026.3651211","DOIUrl":"https://doi.org/10.1109/TDEI.2026.3651211","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 6","pages":"3780-3886"},"PeriodicalIF":3.1,"publicationDate":"2026-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11333921","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145929501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-25DOI: 10.1109/TDEI.2025.3634191
{"title":"IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors","authors":"","doi":"10.1109/TDEI.2025.3634191","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3634191","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 6","pages":"C4-C4"},"PeriodicalIF":3.1,"publicationDate":"2025-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11315173","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-25DOI: 10.1109/TDEI.2025.3640804
Michael Wübbenhorst
{"title":"Letter of Appreciation","authors":"Michael Wübbenhorst","doi":"10.1109/TDEI.2025.3640804","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3640804","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 6","pages":"3775-3779"},"PeriodicalIF":3.1,"publicationDate":"2025-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11315174","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824304","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-25DOI: 10.1109/TDEI.2025.3634189
{"title":"IEEE Dielectrics and Electrical Insulation Society Information","authors":"","doi":"10.1109/TDEI.2025.3634189","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3634189","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 6","pages":"C3-C3"},"PeriodicalIF":3.1,"publicationDate":"2025-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11315177","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-23DOI: 10.1109/TDEI.2025.3623573
Marek Florkowski;Maciej Kuniewski;Paweł Mikrut
Interpretation of dielectric losses is critical for high-voltage insulation reliability and long-term endurance. Electrical insulation in various sectors, such as power grids and transportation electrification, is exposed to high voltages (HVs) containing harmonics due to ubiquitous power electronic-based conversions, nonlinear elements, and transients. This letter highlights the contribution of partial discharge (PD)-related power losses. In particular, it presents a methodology for the quantitative extraction of PD-related power losses caused by HV harmonics, as well as the role of the phase angle in either amplifying or attenuating these components. The investigation is performed on a polyethylene specimen, typical for HV insulation. The results clearly indicate the influence of the harmonic phase angle on the quantitative contribution to PD power losses. The presented methodology can be useful both in the design of HV insulation systems and for diagnostic purposes.
{"title":"Effect of Phase Angle of High-Voltage Harmonics on PD Power Losses","authors":"Marek Florkowski;Maciej Kuniewski;Paweł Mikrut","doi":"10.1109/TDEI.2025.3623573","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3623573","url":null,"abstract":"Interpretation of dielectric losses is critical for high-voltage insulation reliability and long-term endurance. Electrical insulation in various sectors, such as power grids and transportation electrification, is exposed to high voltages (HVs) containing harmonics due to ubiquitous power electronic-based conversions, nonlinear elements, and transients. This letter highlights the contribution of partial discharge (PD)-related power losses. In particular, it presents a methodology for the quantitative extraction of PD-related power losses caused by HV harmonics, as well as the role of the phase angle in either amplifying or attenuating these components. The investigation is performed on a polyethylene specimen, typical for HV insulation. The results clearly indicate the influence of the harmonic phase angle on the quantitative contribution to PD power losses. The presented methodology can be useful both in the design of HV insulation systems and for diagnostic purposes.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 6","pages":"3768-3771"},"PeriodicalIF":3.1,"publicationDate":"2025-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-20DOI: 10.1109/TDEI.2025.3623574
Ryotaro Ozaki;Takahiro Mihara;Kazunori Kadowaki
The electric-field dependence of the effective mobility in low-density polyethylene (LDPE) is experimentally investigated under high electric fields. The spatial profiles of space charge and internal electric field are measured using the pulsed electroacoustic (PEA) method. Combining these measurements with current density provides the spatial profile of the effective mobility in the sample. The effective mobility decreases exponentially with increasing the electric field, revealing negative electric-field-dependent mobility behavior.
{"title":"Experimental Evaluation of Spatial Distribution of Electric-Field-Dependent Mobility in LDPE","authors":"Ryotaro Ozaki;Takahiro Mihara;Kazunori Kadowaki","doi":"10.1109/TDEI.2025.3623574","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3623574","url":null,"abstract":"The electric-field dependence of the effective mobility in low-density polyethylene (LDPE) is experimentally investigated under high electric fields. The spatial profiles of space charge and internal electric field are measured using the pulsed electroacoustic (PEA) method. Combining these measurements with current density provides the spatial profile of the effective mobility in the sample. The effective mobility decreases exponentially with increasing the electric field, revealing negative electric-field-dependent mobility behavior.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 6","pages":"3772-3774"},"PeriodicalIF":3.1,"publicationDate":"2025-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Interfacial pressure is a critical operational parameter for cable accessories, requiring accurate evaluation throughout service life. However, the nonhomogeneous degradation induced by radially gradient-distributed mechanical stress significantly complicates this evaluation. This study investigates the influence of stretching ratio on the stress relaxation behavior of silicone rubber (SR). A nonhomogeneous operational model for cable accessories is established to accurately evaluate interfacial pressure evolution. Comparative analysis with traditional homogeneous models reveals that although both systems exhibit comparable long-term interfacial pressure reduction patterns, their degradation rates differ substantially. Crucially, a characteristic point is identified, where interfacial pressure behavior converges in both systems, enabling simplified prediction of pressure variation in actual nonhomogeneous degradation conditions using homogeneous approximations.
{"title":"Accurate Evaluation of Interfacial Pressure in Cable Accessories Subject to Nonhomogeneous Degradation","authors":"Hao Hu;Wen Xu;Weinan Fan;Yunxiao Zhang;Yuhao Liu;Zhidong Jia","doi":"10.1109/TDEI.2025.3620766","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3620766","url":null,"abstract":"Interfacial pressure is a critical operational parameter for cable accessories, requiring accurate evaluation throughout service life. However, the nonhomogeneous degradation induced by radially gradient-distributed mechanical stress significantly complicates this evaluation. This study investigates the influence of stretching ratio on the stress relaxation behavior of silicone rubber (SR). A nonhomogeneous operational model for cable accessories is established to accurately evaluate interfacial pressure evolution. Comparative analysis with traditional homogeneous models reveals that although both systems exhibit comparable long-term interfacial pressure reduction patterns, their degradation rates differ substantially. Crucially, a characteristic point is identified, where interfacial pressure behavior converges in both systems, enabling simplified prediction of pressure variation in actual nonhomogeneous degradation conditions using homogeneous approximations.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 6","pages":"3764-3767"},"PeriodicalIF":3.1,"publicationDate":"2025-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-01DOI: 10.1109/TDEI.2025.3612607
{"title":"IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors","authors":"","doi":"10.1109/TDEI.2025.3612607","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3612607","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"C4-C4"},"PeriodicalIF":3.1,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11185763","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145210134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-09-30DOI: 10.1109/TDEI.2025.3612605
{"title":"IEEE Dielectrics and Electrical Insulation Society Information","authors":"","doi":"10.1109/TDEI.2025.3612605","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3612605","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"C3-C3"},"PeriodicalIF":3.1,"publicationDate":"2025-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11185360","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145190286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
XY equivalent structure model plays a crucial role in characterizing insulation states of oil-paper insulation system (OPIS) in power transformers based on frequency-domain spectroscopy (FDS). However, the conventional modeling method of OPIS only considers simplified calculation of complex permittivity for insulating mineral oil (IMO) under low field. This could cause large deviations and cannot meet high-field reality. Therefore, this article develops a new XY equivalent structure model to characterize the insulation dielectric performance of OPIS, including IMO and oil-impregnated paperboard (OIP), based on high-field FDS. First, the modeling processes of the XY model of OPIS are investigated as a function of the electric field. Then, the complex permittivity behaviors of IMO, OIP, and OPIS subject to diverse electric fields are discussed, respectively. Subsequently, according to high-field dielectric behaviors, a new calculation approach of complex permittivity of IMO is proposed, introducing two field-related parameters and an electric field enhancement factor $tau $ (E). Finally, the effectiveness of the new field-dependent XY model for OPIS is validated using the high-field complex permittivity of IMO. Compared with the traditional model, this work can accurately characterize field-dependent dielectric behaviors of OPIS in power transformers. This article will provide a solid foundation for health management and prognostics of OPIS in power transformers.
{"title":"Electric Field-Dependent XY Equivalent Structure Modeling of Oil-Paper Insulation Systems in Power Transformers: Improvement and Verification","authors":"Guochao Qian;Xize Dai;Shilin Shi;Qian Zeng;Weiju Dai;Jian Hao","doi":"10.1109/TDEI.2025.3600558","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3600558","url":null,"abstract":"XY equivalent structure model plays a crucial role in characterizing insulation states of oil-paper insulation system (OPIS) in power transformers based on frequency-domain spectroscopy (FDS). However, the conventional modeling method of OPIS only considers simplified calculation of complex permittivity for insulating mineral oil (IMO) under low field. This could cause large deviations and cannot meet high-field reality. Therefore, this article develops a new XY equivalent structure model to characterize the insulation dielectric performance of OPIS, including IMO and oil-impregnated paperboard (OIP), based on high-field FDS. First, the modeling processes of the XY model of OPIS are investigated as a function of the electric field. Then, the complex permittivity behaviors of IMO, OIP, and OPIS subject to diverse electric fields are discussed, respectively. Subsequently, according to high-field dielectric behaviors, a new calculation approach of complex permittivity of IMO is proposed, introducing two field-related parameters and an electric field enhancement factor <inline-formula> <tex-math>$tau $ </tex-math></inline-formula>(E). Finally, the effectiveness of the new field-dependent XY model for OPIS is validated using the high-field complex permittivity of IMO. Compared with the traditional model, this work can accurately characterize field-dependent dielectric behaviors of OPIS in power transformers. This article will provide a solid foundation for health management and prognostics of OPIS in power transformers.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"2986-2994"},"PeriodicalIF":3.1,"publicationDate":"2025-08-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145190144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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