High-Speed Imaging and Quantitative Analysis of Non-Equilibrium Stochastic Processes Using Atomic-Resolution Electron Microscopy

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-07-16 DOI:10.1093/bulcsj/uoae082
Takayuki Nakamuro
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Abstract

Chemical phenomena are inherently complex and stochastic, making them difficult to fully understand using conventional ensemble-averaged analytical methods. These methods primarily capture long-lived species and common structural features, limiting the study of transient intermediates and minute structural characteristics. In contrast, single-molecule time-resolved analysis using advanced microscopy techniques, particularly transmission electron microscopy (TEM), offers high spatial and temporal resolution to observe the nonequilibrium dynamics of molecules and their assemblies. This account discusses the authors’ research on developing TEM techniques to visualize intricate and transient interactions within molecular systems, enhancing the understanding of chemical phenomena at atomic and molecular levels.
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利用原子分辨率电子显微镜对非平衡态随机过程进行高速成像和定量分析
化学现象本身具有复杂性和随机性,因此难以用传统的集合平均分析方法完全理解。这些方法主要捕捉长寿命物种和常见结构特征,限制了对瞬时中间产物和微小结构特征的研究。相比之下,利用先进的显微镜技术,特别是透射电子显微镜(TEM)进行单分子时间分辨分析,可提供高空间和时间分辨率,观察分子及其组装体的非平衡动态。这篇文章讨论了作者在开发 TEM 技术方面的研究,这些技术可将分子系统内错综复杂的瞬时相互作用可视化,从而加深对原子和分子水平化学现象的理解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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