Evaluating the transferability of airborne laser scanning derived stem size prediction models for
Pinus taeda
L. stem size estimation to two different locations and acquisition specifications
M. Sumnall, David R. Carter, T. Albaugh, Erik Platt, Trevor Host, Rachel L. Cook, O. C. Campoe, R. Rubilar
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期刊介绍：
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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CAS
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