Probing buried interface band dispersion of a MgO/Fe heterostructure with hard X-ray angle-resolved photoemission

Shigenori Ueda, Masaki Mizuguchi
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Abstract

Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2p -Fe 3d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only bulk band but also buried interface band of heterojunctions.
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用硬 X 射线角分辨光发射探测氧化镁/铁异质结构的埋藏界面带色散
利用硬 X 射线角分辨光发射光谱 (HARPES),在 3.29 keV 的激发光子能量下,利用 X 射线全反射 (TR) 技术检测了氧化镁(2 nm)/铁(50 nm)异质结构的界面带色散。将 HARPES 在非 TR 条件下获得的埋藏 Fe(001) 的体敏感带色散与 TR-HARPES 获得的近界面敏感 Fe(001) 带色散相减,可以清楚地揭示异界面上 Fe 的带折叠和 O 2p -Fe 3d 杂化。这些结果表明,HARPES 不仅能探测异质结的体带,还能探测异质结的埋藏界面带。
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