The Backscatter Gating method for time, energy, and position resolution characterization of long form factor organic scintillators

H.N. Ratliff, T. Kögler, G. Pausch, L. Setterdahl, K. Skjerdal, J. Turko, I. Meric
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Abstract

This work details a Compton-scattering-based methodology, referred to as Backscatter Gating (BSG), for characterizing the time, energy, and position resolutions of long form factor organic scintillators using a single, fairly minimal measurement setup. Such a method can ease the experimental burden in scenarios where many such scintillator elements may need to be individually characterized before assembly into a larger detector system. A thorough theoretical exploration of the systematic parameters is provided, and the BSG method is then demonstrated by a series of experimental measurements. This “complete” characterization via the BSG method is novel, having previously been used primarily for energy resolution characterization. The method also allows for determination of the assembled scintillator's technical attenuation length and provides a means of verifying the presence or absence of flaws within the scintillator or its optical coupling.
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用于长尺寸有机闪烁体的时间、能量和位置分辨率表征的背向散射门控方法
这项工作详细介绍了一种基于康普顿散射的方法(称为背向散射门控(BSG)),该方法可用于使用单一、相当简便的测量装置对长尺寸有机闪烁体的时间、能量和位置分辨率进行表征。这种方法可以减轻实验负担,因为在将许多此类闪烁体元件组装到更大的探测器系统之前,可能需要对它们进行单独表征。本文对系统参数进行了深入的理论探讨,然后通过一系列实验测量对 BSG 方法进行了演示。这种通过 BSG 方法进行 "完整 "表征的方法非常新颖,以前主要用于能量分辨率表征。该方法还可以确定组装闪烁体的技术衰减长度,并提供一种验证闪烁体或其光学耦合是否存在缺陷的方法。
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