ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions

Abstract

Traditional ADC dynamic parameter testing algorithms have high requirements for signal amplitude, purity, and coherence, which not only have high test cost but also low efficiency. Therefore, a set of ADC dynamic parameter testing algorithms was developed to relax the testing conditions. The algorithm fits the clipped signal through an interpolated fitting algorithm to obtain the residual sequence to relax the input signal amplitude limit; reduces the parameter fitting error and spectral leakage on the spurious components by data preprocessing, restores the ADC's own parameters by external noise cancellation method. Under 14-bit signal source, 5.2-V amplitude, and 0.3 leakage, the signal-to-noise ratio, signal-to-noise-and-distortion ratio, effective-number- of-bits, and total-harmonic-distortion of the 16-bit ADC chip 7606 have errors from the typical values of 0.39 dB, 0.23 dB, 0.16 bit, and 7.24 dB, respectively, which are within the manual range. The results demonstrate the functionality and robustness of the proposed relaxed testing algorithm.