B. E. Umirzakov, J. Sh. Sodikjanov, Z. A. Isakhanov, A. A. Abduvayitov
{"title":"Effect of the Implantation of $${\\text{O}}_{{\\text{2}}}^{ + }$$ Ions on the Composition and Electronic Structure of CdS Films","authors":"B. E. Umirzakov, J. Sh. Sodikjanov, Z. A. Isakhanov, A. A. Abduvayitov","doi":"10.1134/s1027451024700150","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">\n<b>Abstract</b>—</h3><p>A method of low-energy ion implantation is used for the first time to create oxide layers on the surface of a CdS material. After annealing at a temperature of 800 K of CdS implanted with <span>\\({\\text{O}}_{2}^{ + }\\)</span> ions with an energy of <i>E</i><sub>0</sub> = 1 keV at a dose of <i>D</i><sub>sat</sub> ≈ 8 × 10<sup>16</sup> cm<sup>–2</sup>, a three-component film of CdO<sub>0.7</sub>S<sub>0.3</sub> is formed, and after annealing at 900 K a CdO film is formed. Using Auger-electron spectroscopy, photoelectron spectroscopy, and light-absorption spectroscopy, the composition, parameters of the energy bands, optical parameters, and densities of state of valence electrons of CdO<sub>0.7</sub>S<sub>0.3</sub> and CdO nanofilms are determined. The results of the study allow one to consider the possibility of using CdO<sub>0.7</sub>S<sub>0.3</sub> films as transparent films and contact layers in various devices including solar cells.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":null,"pages":null},"PeriodicalIF":0.5000,"publicationDate":"2024-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1134/s1027451024700150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract—
A method of low-energy ion implantation is used for the first time to create oxide layers on the surface of a CdS material. After annealing at a temperature of 800 K of CdS implanted with \({\text{O}}_{2}^{ + }\) ions with an energy of E0 = 1 keV at a dose of Dsat ≈ 8 × 1016 cm–2, a three-component film of CdO0.7S0.3 is formed, and after annealing at 900 K a CdO film is formed. Using Auger-electron spectroscopy, photoelectron spectroscopy, and light-absorption spectroscopy, the composition, parameters of the energy bands, optical parameters, and densities of state of valence electrons of CdO0.7S0.3 and CdO nanofilms are determined. The results of the study allow one to consider the possibility of using CdO0.7S0.3 films as transparent films and contact layers in various devices including solar cells.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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