V. E. Pukha, A. A. Belmesov, E. N. Kabachkov, G. V. Nechaev, I. N. Lukina, E. I. Drozdova, O. P. Chernogorova
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引用次数: 0
Abstract
The first results of the deposition of coatings from accelerated ions of fluorinated fullerene C60(CF3)12 are presented. The coatings are formed at room temperature on Si substrates from a beam of singly charged \({{{\text{C}}}_{{60}}}({\text{C}}{{{\text{F}}}_{3}})_{{12}}^{ + }\) ions with an energy of 5 keV, as well as from an ion beam that also contains doubly charged \({{{\text{C}}}_{{60}}}({\text{C}}{{{\text{F}}}_{3}})_{{12}}^{{2 + }}\) ions and a certain amount of ionized fragments of molecules. The properties and structure of coatings obtained from accelerated ions of fluorinated fullerene are compared with the properties and structure of coatings obtained from accelerated fullerene C60 ions under the same conditions. According to X-ray photoelectron spectroscopy (XPS), fluorinated fullerene coatings contain about 4% fluorine. Investigations of the coatings structure and chemical bonds by X-ray photoelectron spectroscopy and Raman scattering show that the presence of fluorine leads to a decrease in the content of sp3-bonds in the coatings and the formation of graphite-like sp2-structures. Coating hardness (H) and Young’s modulus (E) compared to C60 ion coatings decrease from 36 to 18 GPa and from 245 to 133 GPa, respectively, while the H/E ratio remains the same (~0.14). Tribological tests have shown for all coatings the friction coefficient is close to 0.1. All coatings are also characterized by a very low wear, less than 10–7 mm3/(N m). For coatings obtained from C60(CF3)12 ions, the contact angle is ~76°–78°. In the absence of fluorine, for the coating obtained from C60 ions, it is ~90°.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.