Two-Dimensional Pyroelectric Material with Heat-Transfer Modulation

A. M. Pugachev, A. A. Sokolov, I. O. Akhundov, N. V. Protasevich
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Abstract

Strontium barium niobate SrxBa1 – xNb2O6 films, grown by plasma sputtering on layers of indium tin oxide and platinum on silicon and sapphire substrates, are investigated. Such materials are used in pyroelectric electro-optical converters of a new generation. A two orders of magnitude higher sensitivity to temperature change is detected in some of the investigated films compared to crystalline SrxBa1 – xNb2O6, the pyroelectric coefficient of which is γ ~ 6 × 10−4 C/m2 K. The observed phenomenon is explained by the emergence of mobile elements in the “substrate–bottom electrode–ferroelectric–top electrode” system when the top electrode is detached from the ferroelectric. Leakage currents are unevenly distributed across the surface, often concentrated at local points or areas that can be considered one dimensional. It is known that the boundaries of ferroelectric domain walls exhibit abnormally high conductivity. In contrast to a tightly pressed electrode, where charge leakage may occur through it, in this structure, all the charge resulting from the change in spontaneous polarization during heating is transferred to the external circuit. This process occurs because the leakage-current points are local, and in the absence of a pressed electrode, the current flows along the surface.

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具有传热调制功能的二维热释电材料
摘要 研究了通过等离子溅射法在硅和蓝宝石衬底上的氧化铟锡层和铂层上生长的铌酸钡锶 SrxBa1 - xNb2O6 薄膜。这种材料可用于新一代热释电光转换器。与晶体 SrxBa1 - xNb2O6(其热释电系数为 γ ~ 6 × 10-4 C/m2 K)相比,在一些被研究的薄膜中检测到的对温度变化的灵敏度高出两个数量级。泄漏电流在表面上分布不均,通常集中在局部点或区域,可视为一维。众所周知,铁电体畴壁的边界具有异常高的导电性。与可能发生电荷泄漏的紧压电极不同,在这种结构中,加热过程中自发极化变化产生的所有电荷都会转移到外部电路。出现这一过程的原因是漏电流点是局部的,而在没有压紧电极的情况下,电流是沿着表面流动的。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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