Jan Christian Danz, Simone Stöckli, Christian Per Rank
{"title":"Precision and accuracy of craniofacial growth and orthodontic treatment evaluation by digital image correlation: a prospective cohort study","authors":"Jan Christian Danz, Simone Stöckli, Christian Per Rank","doi":"10.3389/froh.2024.1419481","DOIUrl":null,"url":null,"abstract":"A precise and accurate method for structural superimposition is essential for analyzing dentofacial growth and orthodontic or surgical treatment in longitudinal studies. The errors associated with different superimposition methods have not yet been assessed in high-quality studies.This study aimed to assess the precision and accuracy of digital image correlation (DIC) for structural superimposition.Two cephalometric images from 30 consecutive patients were superimposed using three DIC methods, each measured twice by two examiners. Areas including the contours of the sella, the whole cranial base (CB), and Walker's point and lamina cribrosa (WPLC) were compared using a random coefficient model. Inter-rater and intra-rater errors were assessed for each method.WPLC provided the best precision for image rotation and cephalometric landmarks. Systematic bias was observed between the WPLC and CB methods for image rotation and most landmarks. The intra-rater error in image rotation during DIC was strongly correlated with the intra-rater error in the landmarks of the anterior nasal spine, articulare, and pogonion.Structural superimposition using DIC with WPLC is a precise method for analyzing dentofacial growth and orthodontic or surgical treatment. Moreover, the best method is the measurement of longitudinal dental and craniofacial changes on structurally superimposed cephalometric radiographs with WPLC and a reference grid including the true vertical and horizontal lines from Walker's point.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"1 1","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"0","ListUrlMain":"https://doi.org/10.3389/froh.2024.1419481","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A precise and accurate method for structural superimposition is essential for analyzing dentofacial growth and orthodontic or surgical treatment in longitudinal studies. The errors associated with different superimposition methods have not yet been assessed in high-quality studies.This study aimed to assess the precision and accuracy of digital image correlation (DIC) for structural superimposition.Two cephalometric images from 30 consecutive patients were superimposed using three DIC methods, each measured twice by two examiners. Areas including the contours of the sella, the whole cranial base (CB), and Walker's point and lamina cribrosa (WPLC) were compared using a random coefficient model. Inter-rater and intra-rater errors were assessed for each method.WPLC provided the best precision for image rotation and cephalometric landmarks. Systematic bias was observed between the WPLC and CB methods for image rotation and most landmarks. The intra-rater error in image rotation during DIC was strongly correlated with the intra-rater error in the landmarks of the anterior nasal spine, articulare, and pogonion.Structural superimposition using DIC with WPLC is a precise method for analyzing dentofacial growth and orthodontic or surgical treatment. Moreover, the best method is the measurement of longitudinal dental and craniofacial changes on structurally superimposed cephalometric radiographs with WPLC and a reference grid including the true vertical and horizontal lines from Walker's point.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico