Exploring Edge Computing for Sustainable CV-Based Worker Detection in Construction Site Monitoring: Performance and Feasibility Analysis

IF 4.7 3区材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-07-25 DOI:10.3390/buildings14082299

Xue Xiao, Chen Chen, Martin Skitmore, Heng Li, Yue Deng

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Abstract

This research explores edge computing for construction site monitoring using computer vision (CV)-based worker detection methods. The feasibility of using edge computing is validated by testing worker detection models (yolov5 and yolov8) on local computers and three edge computing devices (Jetson Nano, Raspberry Pi 4B, and Jetson Xavier NX). The results show comparable mAP values for all devices, with the local computer processing frames six times faster than the Jetson Xavier NX. This study contributes by proposing an edge computing solution to address data security, installation complexity, and time delay issues in CV-based construction site monitoring. This approach also enhances data sustainability by mitigating potential risks associated with data loss, privacy breaches, and network connectivity issues. Additionally, it illustrates the practicality of employing edge computing devices for automated visual monitoring and provides valuable information for construction managers to select the appropriate device.

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探索边缘计算在建筑工地监控中基于 CV 的可持续工人检测：性能与可行性分析

本研究利用基于计算机视觉（CV）的工人检测方法，探索边缘计算在建筑工地监控中的应用。通过在本地计算机和三种边缘计算设备（Jetson Nano、Raspberry Pi 4B 和 Jetson Xavier NX）上测试工人检测模型（yolov5 和 yolov8），验证了使用边缘计算的可行性。结果显示，所有设备的 mAP 值相当，本地计算机处理帧的速度是 Jetson Xavier NX 的六倍。本研究提出了一种边缘计算解决方案，以解决基于 CV 的建筑工地监控中的数据安全性、安装复杂性和时间延迟问题。这种方法还能降低与数据丢失、隐私泄露和网络连接问题相关的潜在风险，从而增强数据的可持续性。此外，它还说明了采用边缘计算设备进行自动可视化监控的实用性，并为施工管理人员选择合适的设备提供了有价值的信息。

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来源期刊

ACS Applied Electronic Materials Multiple-

CiteScore

7.20

自引率

4.30%

发文量

567

期刊介绍： ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/Abstracted： Web of Science SCIE Scopus CAS INSPEC Portico

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