{"title":"Bolt looseness localization with connection-stiffness-varying flange","authors":"Hao Huang, Qingbo He","doi":"10.1088/1361-665x/ad6725","DOIUrl":null,"url":null,"abstract":"\n Electromechanical impedance analysis is a traditional method to identify the occurrence of bolt looseness, but accurate localization of blot looseness is hard to realize on the flange. In this study, a flange model with bolt connection stiffness varying with position is proposed. The location of bolt looseness can be then determined from the impedance spectrum of the model since the uniformity and symmetry of the flange are broken. The analytic model is established to reveal the distinguishability of the eigenfrequency shifting characteristics when the connection stiffness at different positions changes. The frequency shifting sequence is extracted from the coupling impedance spectrum as a feature, and the correlation between the sequences corresponding to bolt looseness at different positions is low. The relationship between the sequence and the degree of looseness is highly related so that the unknown degree of looseness can be matched with the calibrated sequence to realize the localization of the looseness. Based on the distinguishability of the frequency shifting sequence, the connection-stiffness-varying model shows great potential in the field of flanges or other connecting structures for structural health monitoring and damage localization.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"44 7","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1088/1361-665x/ad6725","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Electromechanical impedance analysis is a traditional method to identify the occurrence of bolt looseness, but accurate localization of blot looseness is hard to realize on the flange. In this study, a flange model with bolt connection stiffness varying with position is proposed. The location of bolt looseness can be then determined from the impedance spectrum of the model since the uniformity and symmetry of the flange are broken. The analytic model is established to reveal the distinguishability of the eigenfrequency shifting characteristics when the connection stiffness at different positions changes. The frequency shifting sequence is extracted from the coupling impedance spectrum as a feature, and the correlation between the sequences corresponding to bolt looseness at different positions is low. The relationship between the sequence and the degree of looseness is highly related so that the unknown degree of looseness can be matched with the calibrated sequence to realize the localization of the looseness. Based on the distinguishability of the frequency shifting sequence, the connection-stiffness-varying model shows great potential in the field of flanges or other connecting structures for structural health monitoring and damage localization.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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