{"title":"Crack Detection and Feature Extraction of Heritage Buildings via Point Clouds: A Case Study of Zhonghua Gate Castle in Nanjing","authors":"Helong Wang, Yufeng Shi, Qi Yuan, Mingyue Li","doi":"10.3390/buildings14082278","DOIUrl":null,"url":null,"abstract":"Zhonghua Gate Castle is on the tentative list for Chinese World Cultural Heritage. Due to long-term sunshine, rain erosion, and man-made damage, its surface appears to have different degrees of cracks and other diseases. This paper centers on Zhonghua Gate Castle; terrestrial laser scanning is used to obtain the exterior wall point cloud data. A crack detection method based on point cloud data curved surface reconstruction is proposed. It involves data preprocessing, crack detection, and the analysis of crack features. This method initially uses data preprocessing techniques to improve data quality. These techniques include removing ground points and super-voxel segmentation. Subsequently, local surface reconstruction was employed to address the issue of missing point cloud data within cracks and the Euclidean clustering algorithm was used for precise crack identification. The article provides a detailed analysis of the geometric characteristics of cracks. They involve the calculation of length, width, and area. The results of the experiment demonstrate that the method could successfully identify cracks and extract geometric features and has millimeter-level accuracy compared to actual crack sizes.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"49 2","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.3390/buildings14082278","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Zhonghua Gate Castle is on the tentative list for Chinese World Cultural Heritage. Due to long-term sunshine, rain erosion, and man-made damage, its surface appears to have different degrees of cracks and other diseases. This paper centers on Zhonghua Gate Castle; terrestrial laser scanning is used to obtain the exterior wall point cloud data. A crack detection method based on point cloud data curved surface reconstruction is proposed. It involves data preprocessing, crack detection, and the analysis of crack features. This method initially uses data preprocessing techniques to improve data quality. These techniques include removing ground points and super-voxel segmentation. Subsequently, local surface reconstruction was employed to address the issue of missing point cloud data within cracks and the Euclidean clustering algorithm was used for precise crack identification. The article provides a detailed analysis of the geometric characteristics of cracks. They involve the calculation of length, width, and area. The results of the experiment demonstrate that the method could successfully identify cracks and extract geometric features and has millimeter-level accuracy compared to actual crack sizes.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico