Ultrafast response self-powered UV photodetectors based on ZnO/SiO2/Si heterojunction diodes

Samer Abdulsalam Aldhehabi, B. Belkerk, R. Zernadji, Amine Achour, M. Djouadi
{"title":"Ultrafast response self-powered UV photodetectors based on ZnO/SiO2/Si heterojunction diodes","authors":"Samer Abdulsalam Aldhehabi, B. Belkerk, R. Zernadji, Amine Achour, M. Djouadi","doi":"10.35848/1347-4065/ad65ab","DOIUrl":null,"url":null,"abstract":"\n This paper presents ultrafast response, self-powered UV photodetectors (PDs) based on ZnO/SiO2/Si heterojunction diodes, utilizing zinc oxide (ZnO) nanorods as the photosensitive layer. This configuration results in photodetectors exhibiting unprecedentedly rapid response times, with rise and decay times reduced to 440 ns and 320 ns, respectively. Our study, focusing on ZnO nanorod PDs, not only demonstrates ultrafast response times but also highlights the role of hydrothermal synthesis temperature in tuning the devices' performance. These findings represent a significant leap forward in the development of high-performance, self-powered UV PDs. The effects of different temperature hydrothermal on the morphology, crystal structure, and optoelectrical properties were systematically investigated using various characterization techniques, including field-emission scanning electron microscopy (FE-SEM), energy dispersive X-ray analysis (EDX), X-ray diffraction (XRD) analysis, photoluminescence analysis, and current-voltage (I-V) measurements.","PeriodicalId":505044,"journal":{"name":"Japanese Journal of Applied Physics","volume":"103 21","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Japanese Journal of Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.35848/1347-4065/ad65ab","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper presents ultrafast response, self-powered UV photodetectors (PDs) based on ZnO/SiO2/Si heterojunction diodes, utilizing zinc oxide (ZnO) nanorods as the photosensitive layer. This configuration results in photodetectors exhibiting unprecedentedly rapid response times, with rise and decay times reduced to 440 ns and 320 ns, respectively. Our study, focusing on ZnO nanorod PDs, not only demonstrates ultrafast response times but also highlights the role of hydrothermal synthesis temperature in tuning the devices' performance. These findings represent a significant leap forward in the development of high-performance, self-powered UV PDs. The effects of different temperature hydrothermal on the morphology, crystal structure, and optoelectrical properties were systematically investigated using various characterization techniques, including field-emission scanning electron microscopy (FE-SEM), energy dispersive X-ray analysis (EDX), X-ray diffraction (XRD) analysis, photoluminescence analysis, and current-voltage (I-V) measurements.
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基于氧化锌/二氧化硅/硅异质结二极管的超快响应自供电紫外光检测器
本文介绍了基于氧化锌/二氧化硅/硅异质结二极管的超快响应、自供电紫外光光电探测器(PD),利用氧化锌(ZnO)纳米棒作为光敏层。这种配置使光电探测器表现出前所未有的快速响应时间,上升和衰减时间分别缩短到 440 ns 和 320 ns。我们的研究以氧化锌纳米棒光电探测器为重点,不仅展示了超快的响应时间,还强调了水热合成温度在调整器件性能方面的作用。这些发现标志着在开发高性能、自供电紫外光直放电器件方面取得了重大飞跃。利用各种表征技术,包括场发射扫描电子显微镜 (FE-SEM)、能量色散 X 射线分析 (EDX)、X 射线衍射 (XRD) 分析、光致发光分析和电流电压 (I-V) 测量,系统地研究了不同温度水热对形貌、晶体结构和光电特性的影响。
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