Initial testing of Alfvén Eigenmode feedback control with machine-learning observers on DIII-D

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-07-18 DOI:10.1088/1741-4326/ad64e6
Andrew Rothstein, A. Jalalvand, J. Abbate, K. Erickson, E. Kolemen
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Abstract

A first of its kind fully data-driven system has been developed and implemented into the DIII-D plasma control system to detect and control Alfvén Eigenmodes (AE) in real-time. Susceptibility to fast ion-induced AE is a challenge in fully non-inductive tokamak operation, which significantly reduces fast-particle confinement and results in degraded fusion gain. Controlling AEs in real-time to improve fast-ion confinement is, hence, important for future Advanced Tokamak fusion reactors. The models were implemented and tested in experiments which showed that neural networks (NN) are highly effective in detecting 5 types of AE (BAE, EAE, LFM, RSAE, TAE) using high resolution ECE. To estimate the neutron deficit, a neural network has been trained that outputs the classical neutron rate using similar inputs to NUBEAM. Also a preliminary ML-based proportional control has been designed and gone through initial testing in experiment to use feedback-control on the neutral beam power to achieve desired amplitude of AE modes and neutron deficits. The effect of AEs on fast-ion confinement is measured by analysing the gap in classical neutron rate from the proposed NN-based NUBEAM and the measured neutron rate.
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在 DIII-D 上利用机器学习观测器对阿尔芬特征模式反馈控制进行初步测试
在 DIII-D 等离子体控制系统中开发并实施了首个完全由数据驱动的系统,用于实时检测和控制阿尔芬特征码(AE)。在完全非电感托卡马克运行过程中,易受快离子诱发的 AE 影响是一项挑战,这会大大降低快粒子约束,导致聚变增益下降。因此,实时控制 AE 以改善快粒子约束对未来的先进托卡马克聚变反应堆非常重要。实验中对模型进行了实施和测试,结果表明神经网络(NN)在使用高分辨率 ECE 检测 5 种类型的 AE(BAE、EAE、LFM、RSAE、TAE)时非常有效。为了估算中子亏损,已经训练了一个神经网络,利用与 NUBEAM 相似的输入输出经典中子速率。此外,还设计了一种基于 ML 的初步比例控制,并在实验中进行了初步测试,以使用对中性束功率的反馈控制来实现所需的 AE 模式振幅和中子损耗。通过分析所提议的基于 NN 的 NUBEAM 的经典中子速率与所测量的中子速率之间的差距,测量了 AE 对快离子约束的影响。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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