Effect of trace oxygen on self-oscillation of positive glow corona in nitrogen near atmospheric pressure

Hengxin He, Wanxia Zhang, Lipeng Liu, Bin Luo, Ying Chen, Shiming Zhang, Mian Xiao, Yubin Huang, Shen Chen
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Abstract

Positive glow corona is a stable and quasi-homogenous form of corona discharge with periodic current pulses, which appears in atmospheric plasma applications, high voltage apparatus and grounded structures under thunderstorm. The debate on seed electron source responsible for pulsing nature of positive glow corona has persisted for decades. This paper presents the numerical simulation study of 1-D coaxial positive glow corona in pure N2 with trace oxygen contents ranging from 1% to 1 ppm. It is found that the reduction of oxygen content causes weaker glow current magnitude, longer time-to-crest, shorter oscillation period and more positive ion sheaths. As trace oxygen decreases from 1% to 10 ppm, the dominant source of secondary electrons transits from both detachment and photoionization to photoionization only. As trace O2 content drops from 0.1%, the dominant photoionization within ionization layer transits from the photoionization of O2 molecules to direct photoionization of N2 molecules. In high purity nitrogen, the detachment of O− dominates and the detachment of O2− can be neglected. As the trace oxygen decreases from 1% to 10 ppm, the dominant molecules involving O− detachment transits from N2 and O to N2(A). The dominant ionization responsible for electron multiplication during electric field recovery shifts from direct ionization of O2 and N2 in 1% trace oxygen to associative ionization between N2(A) and N2(a’) and direct ionization of N2 in 1ppm trace oxygen.
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微量氧对氮气中接近大气压的正辉电晕自振荡的影响
正辉光电晕是一种稳定、准同质的电晕放电形式,具有周期性电流脉冲,出现在大气等离子体应用、高压设备和雷暴天气下的接地结构中。关于造成正辉光电晕脉冲性质的种子电子源的争论已经持续了几十年。本文对纯氮气中的一维同轴正辉光电晕进行了数值模拟研究,氮气中的微量氧含量从 1%到 1 ppm 不等。研究发现,氧含量的减少会导致辉光电流强度减弱、波峰时间延长、振荡周期缩短和正离子鞘增多。当痕量氧含量从 1% 降至 10 ppm 时,二次电子的主要来源从分离和光离子化转变为仅光电离。随着痕量氧气含量从 0.1% 下降,电离层内的主要光离子化从 O2 分子的光离子化转变为 N2 分子的直接光离子化。在高纯氮中,O- 的脱离占主导地位,O2- 的脱离可以忽略。当痕量氧从 1% 降到 10 ppm 时,涉及 O- 分离的主要分子从 N2 和 O 转变为 N2(A)。电场恢复期间电子倍增的主要电离方式从 1%痕量氧中的 O2 和 N2 直接电离转变为 N2(A) 和 N2(a')之间的关联电离以及 1ppm 痕量氧中的 N2 直接电离。
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