Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2024-07-20 DOI:10.1016/j.ultramic.2024.114020
Christoph Mahr , Jakob Stahl , Beeke Gerken , Florian F. Krause , Marco Schowalter , Tim Grieb , Lutz Mädler , Andreas Rosenauer
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Abstract

Structural and chemical characterization of nanomaterials provides important information for understanding their functional properties. Nanomaterials with characteristic structure sizes in the nanometer range can be characterized by scanning transmission electron microscopy (STEM). In conventional STEM, two-dimensional (2D) projection images of the samples are acquired, information about the third dimension is lost. This drawback can be overcome by STEM tomography, where the three-dimensional (3D) structure is reconstructed from a series of projection images acquired using various projection directions. However, 3D measurements are expensive with respect to acquisition and evaluation time. Furthermore, the method is hardly applicable to beam-sensitive materials, i.e. samples that degrade under the electron beam. For this reason, it is desirable to know whether sufficient information on structural and chemical information can be extracted from 2D-projection measurements. In the present work, a comparison between 3D-reconstruction and 2D-projection characterization of structure and mixing in nanoparticle hetero-aggregates is provided. To this end, convolutional neural networks are trained in 2D and 3D to extract particle positions and material types from the simulated or experimental measurement. Results are used to evaluate structure, particle size distributions, hetero-aggregate compositions and mixing of particles quantitatively and to find an answer to the question, whether an expensive 3D characterization is required for this material system for future characterizations.

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利用卷积神经网络表征纳米粒子异质聚集体的结构和混合情况:三维重建与二维投影
纳米材料的结构和化学特性为了解其功能特性提供了重要信息。扫描透射电子显微镜(STEM)可对结构尺寸在纳米范围内的纳米材料进行表征。传统的 STEM 是获取样品的二维(2D)投影图像,因此会丢失三维信息。STEM 层析技术可以克服这一缺点,即从一系列使用不同投影方向获取的投影图像中重建三维(3D)结构。然而,三维测量在采集和评估时间上都很昂贵。此外,这种方法很难适用于对光束敏感的材料,即在电子束作用下会发生退化的样品。因此,我们希望了解是否能从二维投影测量中提取足够的结构和化学信息。本研究比较了三维重建和二维投影对纳米粒子异质聚集体结构和混合情况的描述。为此,对卷积神经网络进行了二维和三维训练,以从模拟或实验测量中提取粒子位置和材料类型。研究结果用于定量评估颗粒的结构、粒度分布、异质聚集体成分和混合情况,并为今后是否需要对这种材料系统进行昂贵的三维表征找到答案。
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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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