{"title":"Shape Modification of Vertical Nanowires under Annealing","authors":"A. G. Nastovjak, N. L. Shwartz","doi":"10.3103/s8756699024700262","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>The numerical calculation of the shape modification of vertical nanowires under annealing due to the readsorption of the substance evaporated from the neighboring nanowires and substrate was carried out. The calculation was performed by the model of evaporation from a set of spherically symmetric sources and by the Knudsen–Lambert model. The effect produced on the shape of nanowires by the aspect ratio of the nanowire length to the distance between them and the rate of material evaporation from the nanowire side wall and substrate was analyzed.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"11 1","pages":""},"PeriodicalIF":0.5000,"publicationDate":"2024-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optoelectronics Instrumentation and Data Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3103/s8756699024700262","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
The numerical calculation of the shape modification of vertical nanowires under annealing due to the readsorption of the substance evaporated from the neighboring nanowires and substrate was carried out. The calculation was performed by the model of evaporation from a set of spherically symmetric sources and by the Knudsen–Lambert model. The effect produced on the shape of nanowires by the aspect ratio of the nanowire length to the distance between them and the rate of material evaporation from the nanowire side wall and substrate was analyzed.
期刊介绍：
The scope of Optoelectronics, Instrumentation and Data Processing encompasses, but is not restricted to, the following areas: analysis and synthesis of signals and images; artificial intelligence methods; automated measurement systems; physicotechnical foundations of micro- and optoelectronics; optical information technologies; systems and components; modelling in physicotechnical research; laser physics applications; computer networks and data transmission systems. The journal publishes original papers, reviews, and short communications in order to provide the widest possible coverage of latest research and development in its chosen field.
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