Test, Debug and Silicon Lifecycle Management Architecture for UCIe based Open Chiplet Ecosystem

IF 2.8 3区计算机科学 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Micro Pub Date : 2024-08-01 DOI:10.1109/mm.2024.3435702

Sridhar Muthrasanallur, Yervant Zorian

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基于 UCIe 的开放式芯片生态系统的测试、调试和硅生命周期管理架构

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来源期刊

IEEE Micro 工程技术-计算机：软件工程

CiteScore

7.50

自引率

0.00%

发文量

164

审稿时长

>12 weeks

期刊介绍： IEEE Micro addresses users and designers of microprocessors and microprocessor systems, including managers, engineers, consultants, educators, and students involved with computers and peripherals, components and subassemblies, communications, instrumentation and control equipment, and guidance systems. Contributions should relate to the design, performance, or application of microprocessors and microcomputers. Tutorials, review papers, and discussions are also welcome. Sample topic areas include architecture, communications, data acquisition, control, hardware and software design/implementation, algorithms (including program listings), digital signal processing, microprocessor support hardware, operating systems, computer aided design, languages, application software, and development systems.

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