Study on crack law of shield segment under load variation based on XFEM

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-08-13 DOI:10.1108/ijsi-03-2024-0052
Hong Guo, Xiaokai Niu, Zhitian Xie
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Abstract

PurposeThe occurrence of segment cracks caused by load changes in shield tunnels would affect the safety of the tunnel structure. To this end, a three-dimensional fine shield tunnel segment model based on the extended finite element method (XFEM) is established.Design/methodology/approachThe cracking law of shield segment cracks is studied in two forms: overloading and unloading. The relationship between crack length, width and depth and transverse convergence and deformation is analyzed.FindingsThe results show that the cracks in shield tunnels mainly occur on the outer side of the arch waist and the inner side of the crown and bottom. Under overloading and unloading conditions, the length, width and depth of cracks increase non-linearly as the transverse convergence deformation increases. Under the same convergent deformation, the deeper the buried depth, the smaller the crack length, width and depth. Meanwhile, under overloading conditions, the influence of buried depth on the width and depth of cracks is more significant. In terms of crack width and depth, unloading conditions are more dangerous than overloading conditions.Originality/valueThe findings have a guiding effect for the management of cracks in shield tunnels during operation.
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基于 XFEM 的盾构段荷载变化下的裂缝规律研究
目的盾构隧道中因荷载变化引起的节段裂缝会影响隧道结构的安全性。为此,建立了基于扩展有限元法(XFEM)的三维精细盾构隧道节段模型。设计/方法/途径研究了盾构节段裂缝的两种开裂形式:超载和卸载。结果结果表明,盾构隧道的裂缝主要出现在拱腰外侧、拱顶和拱底内侧。在超载和卸载条件下,随着横向收敛变形的增加,裂缝的长度、宽度和深度呈非线性增加。在相同的收敛变形条件下,埋深越深,裂缝的长度、宽度和深度越小。同时,在超载条件下,埋深对裂缝宽度和深度的影响更为显著。就裂缝宽度和深度而言,空载条件比超载条件更危险。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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