{"title":"Data Quality of National Monitoring Schemes: Filling the Gap between Specialists and the General Public","authors":"Benjamin Bergerot, Benoît Fontaine","doi":"10.3390/land13081252","DOIUrl":null,"url":null,"abstract":"Worldwide, large-scale biodiversity monitoring schemes are developing and involve many non-specialist volunteers. If the opening of schemes to non-specialists allows for the gathering of huge amounts of data, their quality represents a controversial issue. In the framework of the French Garden Butterfly Observatory (FGBO), we studied non-specialist volunteer identification errors based on identifications provided during a one-shot experiment. With 3492 butterfly pictures sent by 554 non-specialist volunteers, we directly measured identification errors and misidentification rates for each butterfly species or species group targeted by the FGBO. The results showed that when non-specialist volunteers identified butterflies at the species level, identification errors (i.e., the misidentification rate) reached 20.9%. It was only 5.0% when FGBO species groups were used. This study provides novel insights into the trade-off between data quantity and quality provided by non-specialist volunteers and shows that if protocols, research questions and identification levels are adapted, participatory monitoring schemes relying on non-specialists represent a powerful and reliable tool to study common species at a large scale and on a long-term basis.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"22 12","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"93","ListUrlMain":"https://doi.org/10.3390/land13081252","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Worldwide, large-scale biodiversity monitoring schemes are developing and involve many non-specialist volunteers. If the opening of schemes to non-specialists allows for the gathering of huge amounts of data, their quality represents a controversial issue. In the framework of the French Garden Butterfly Observatory (FGBO), we studied non-specialist volunteer identification errors based on identifications provided during a one-shot experiment. With 3492 butterfly pictures sent by 554 non-specialist volunteers, we directly measured identification errors and misidentification rates for each butterfly species or species group targeted by the FGBO. The results showed that when non-specialist volunteers identified butterflies at the species level, identification errors (i.e., the misidentification rate) reached 20.9%. It was only 5.0% when FGBO species groups were used. This study provides novel insights into the trade-off between data quantity and quality provided by non-specialist volunteers and shows that if protocols, research questions and identification levels are adapted, participatory monitoring schemes relying on non-specialists represent a powerful and reliable tool to study common species at a large scale and on a long-term basis.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico