Considerations on Possible Directions for a Wide Band Polarimetry X-ray Mission

IF 4.7 3区材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-08-08 DOI:10.3390/galaxies12040047

P. Soffitta, E. Costa, Nicolas De Angelis, E. Del Monte, K. Desch, A. Di Marco, G. Di Persio, S. Fabiani, R. Ferrazzoli, Markus Gruber, Takahashi Hiromitsu, Saba Imtiaz, P. Kaaret, Jochen Kaminski, Dawoon E. Kim, F. Kislat, H. Krawczynski, F. La Monaca, Carlo Lefevre, Hemanth Manikantan, H. Marshall, R. Mikus̆incová, A. Morbidini, F. Muleri, S. O’Dell, T. Okajima, M. Pearce, Vladislavs Plesanovs, B. Ramsey, A. Ratheesh, A. Rubini, Shravan Vengalil Menon, M. Weisskopf

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Abstract

The Imaging X-ray Polarimetry Explorer (IXPE) has confirmed that X-ray polarimetry is a valuable tool in astronomy, providing critical insights into the emission processes and the geometry of compact objects. IXPE was designed to be sensitive in the 2–8 keV energy range for three primary reasons: (1) celestial X-ray sources are bright within this range, (2) the optics are effective, and (3) most sources across various classes were expected to exhibit some level of polarization. Indeed, IXPE is a great success, and its discoveries are necessitating the revision of many theoretical models for numerous sources. However, one of IXPE’s main limitations is its relatively narrow energy band, coupled with rapidly declining efficiency. In this paper, we will demonstrate the benefits of devising a mission focused on a broader energy band (0.1–79 keV). This approach leverages current technologies that align well with theoretical expectations and builds on the successes of IXPE.

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关于宽带偏振测量 X 射线飞行任务可能方向的考虑

成像 X 射线偏振探测仪（IXPE）证实，X 射线偏振探测仪是天文学中的一种宝贵工具，可提供有关发射过程和紧凑天体几何形状的重要见解。IXPE 被设计为在 2-8 keV 能量范围内具有灵敏度，主要有三个原因：(1) 天体 X 射线源在此范围内非常明亮，(2) 光学系统非常有效，(3) 不同类别的大多数源预计都会表现出一定程度的偏振。事实上，IXPE 是一个巨大的成功，它的发现使得许多理论模型必须对众多来源进行修正。然而，IXPE 的主要局限性之一是能带相对较窄，而且效率迅速下降。在本文中，我们将展示设计一个侧重于更宽能段（0.1-79 keV）的任务的好处。这种方法利用了与理论预期完全一致的现有技术，并以 IXPE 的成功为基础。

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来源期刊

ACS Applied Electronic Materials Multiple-

CiteScore

7.20

自引率

4.30%

发文量

567

期刊介绍： ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/Abstracted： Web of Science SCIE Scopus CAS INSPEC Portico