Comparison of the Viscoelastic Properties and Plasticity of Early and Late Wood of Pine and Spruce by Continuous Stiffness Measurement during Nanoindentation
A. I. Tyurin, V. V. Korenkov, A. A. Gusev, I. A. Vasyukova, M. A. Yunak
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引用次数: 0
Abstract
Using a small oscillating load (continuous stiffness measurement, CSM), in addition to the main quasi-static load, we determine the hardness, Young’s modulus, storage and loss moduli, mechanical loss coefficient (\(\tan \delta \)), and the plasticity characteristics in various components of the nanostructure and microstructure of pine (Pinus sylvestris) and spruce (Picea abies) wood. The contribution of structures of different scales to the ratio of the viscoelastic properties of early and late wood in the composition of one annual ring is determined. The plasticity characteristic δА is determined, and the influence of an additional oscillating load on the dynamic parameters of wood is assessed.
期刊介绍:
Nanobiotechnology Reports publishes interdisciplinary research articles on fundamental aspects of the structure and properties of nanoscale objects and nanomaterials, polymeric and bioorganic molecules, and supramolecular and biohybrid complexes, as well as articles that discuss technologies for their preparation and processing, and practical implementation of products, devices, and nature-like systems based on them. The journal publishes original articles and reviews that meet the highest scientific quality standards in the following areas of science and technology studies: self-organizing structures and nanoassemblies; nanostructures, including nanotubes; functional and structural nanomaterials; polymeric, bioorganic, and hybrid nanomaterials; devices and products based on nanomaterials and nanotechnology; nanobiology and genetics, and omics technologies; nanobiomedicine and nanopharmaceutics; nanoelectronics and neuromorphic computing systems; neurocognitive systems and technologies; nanophotonics; natural science methods in a study of cultural heritage items; metrology, standardization, and monitoring in nanotechnology.