AutoRefl: active learning in neutron reflectometry for fast data acquisition

IF 5.2 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Journal of Applied Crystallography Pub Date : 2024-07-31 DOI:10.1107/S1600576724006447
David P. Hoogerheide, Frank Heinrich
{"title":"AutoRefl: active learning in neutron reflectometry for fast data acquisition","authors":"David P. Hoogerheide,&nbsp;Frank Heinrich","doi":"10.1107/S1600576724006447","DOIUrl":null,"url":null,"abstract":"<p>Neutron reflectometry (NR) is a powerful technique for interrogating the structure of thin films at interfaces. Because NR measurements are slow and instrument availability is limited, measurement efficiency is paramount. One approach to improving measurement efficiency is active learning (AL), in which the next measurement configurations are selected on the basis of information gained from the partial data collected so far. <i>AutoRefl</i>, a model-based AL algorithm for neutron reflectometry measurements, is presented in this manuscript. <i>AutoRefl</i> uses the existing measurements of a function to choose both the position and the duration of the next measurement. <i>AutoRefl</i> maximizes the information acquisition rate in specific model parameters of interest and uses the well defined signal-to-noise ratio in counting measurements to choose appropriate measurement times. Since continuous measurement is desirable for practical implementation, <i>AutoRefl</i> features forecasting, in which the optimal positions of multiple future measurements are predicted from existing measurements. The performance of <i>AutoRefl</i> is compared with that of well established best practice measurements for supported lipid bilayer samples using realistic digital twins of monochromatic and polychromatic reflectometers. <i>AutoRefl</i> is shown to improve NR measurement speeds in all cases significantly.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"57 4","pages":"1192-1204"},"PeriodicalIF":5.2000,"publicationDate":"2024-07-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1107/S1600576724006447","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
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Abstract

Neutron reflectometry (NR) is a powerful technique for interrogating the structure of thin films at interfaces. Because NR measurements are slow and instrument availability is limited, measurement efficiency is paramount. One approach to improving measurement efficiency is active learning (AL), in which the next measurement configurations are selected on the basis of information gained from the partial data collected so far. AutoRefl, a model-based AL algorithm for neutron reflectometry measurements, is presented in this manuscript. AutoRefl uses the existing measurements of a function to choose both the position and the duration of the next measurement. AutoRefl maximizes the information acquisition rate in specific model parameters of interest and uses the well defined signal-to-noise ratio in counting measurements to choose appropriate measurement times. Since continuous measurement is desirable for practical implementation, AutoRefl features forecasting, in which the optimal positions of multiple future measurements are predicted from existing measurements. The performance of AutoRefl is compared with that of well established best practice measurements for supported lipid bilayer samples using realistic digital twins of monochromatic and polychromatic reflectometers. AutoRefl is shown to improve NR measurement speeds in all cases significantly.

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AutoRefl:中子反射测量中的主动学习,实现快速数据采集
中子反射测量法(NR)是一种功能强大的技术,可用于探测界面处的薄膜结构。由于中子反射测量速度较慢且仪器有限,因此测量效率至关重要。提高测量效率的一种方法是主动学习(AL),即根据目前收集到的部分数据信息选择下一步的测量配置。本手稿介绍的 AutoRefl 是一种基于模型的中子反射测量 AL 算法。AutoRefl 利用函数的现有测量结果来选择下一次测量的位置和持续时间。AutoRefl 可最大限度地提高特定相关模型参数的信息获取率,并利用计数测量中定义明确的信噪比来选择适当的测量时间。由于在实际应用中需要连续测量,AutoRefl 具有预测功能,即根据现有测量结果预测未来多次测量的最佳位置。使用单色和多色反射仪的现实数字孪晶,将 AutoRefl 的性能与支持脂质双分子层样品的公认最佳测量方法的性能进行了比较。结果表明,在所有情况下,AutoRefl 都能显著提高 NR 测量速度。
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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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