Pub Date : 2025-03-20DOI: 10.1107/S1600576725001591
Andrey Kaveev, Vladimir Fedorov, Dmitry Miniv, Alexandr Goltaev, Demid Kirilenko, Andrey Malenin, Ivan Mukhin
Bismuth nanostructures are quite attractive in the area of colorimetry and semiconductor nanoelectronics because of their multi-coloured luminescence and quantum confinement. In this work, detailed studies of the crystalline structure and surface morphology of bismuth nanostructures grown on a planar CaF2/Si(111) surface have been carried out. The growth was performed using molecular beam epitaxy. The different surface morphologies of Bi on CaF2 are demonstrated. With an increase in temperature from room temperature to 200°C, Bi undergoes a morphology change from planar to island-like, with a tendency to enlargement. At temperatures of 100–125°C, two types of nanowires with different geometric parameters are observed. Bi nano-island nucleation on a grooved and ridged CaF2/Si(001) surface was also studied. X-ray diffraction analysis shows an ordered multiple-domain growth character in all cases. Precise analysis of nanowire and island faceting based on a combination of scanning and transmission electron microscopy and X-ray diffraction simulations has been carried out.
{"title":"Epitaxial growth of bismuth on CaF2/Si(111): from planar films to self-organized arrays of nanostructures","authors":"Andrey Kaveev, Vladimir Fedorov, Dmitry Miniv, Alexandr Goltaev, Demid Kirilenko, Andrey Malenin, Ivan Mukhin","doi":"10.1107/S1600576725001591","DOIUrl":"https://doi.org/10.1107/S1600576725001591","url":null,"abstract":"<p>Bismuth nanostructures are quite attractive in the area of colorimetry and semiconductor nanoelectronics because of their multi-coloured luminescence and quantum confinement. In this work, detailed studies of the crystalline structure and surface morphology of bismuth nanostructures grown on a planar CaF<sub>2</sub>/Si(111) surface have been carried out. The growth was performed using molecular beam epitaxy. The different surface morphologies of Bi on CaF<sub>2</sub> are demonstrated. With an increase in temperature from room temperature to 200°C, Bi undergoes a morphology change from planar to island-like, with a tendency to enlargement. At temperatures of 100–125°C, two types of nanowires with different geometric parameters are observed. Bi nano-island nucleation on a grooved and ridged CaF<sub>2</sub>/Si(001) surface was also studied. X-ray diffraction analysis shows an ordered multiple-domain growth character in all cases. Precise analysis of nanowire and island faceting based on a combination of scanning and transmission electron microscopy and X-ray diffraction simulations has been carried out.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"58 2","pages":"419-428"},"PeriodicalIF":5.2,"publicationDate":"2025-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143741091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-03-19DOI: 10.1107/S1600576725001360
Cameron S. Vojvodin, Sean T. Holmes, Christine E. A. Kirschhock, David A. Hirsh, Igor Huskić, Sanjaya Senanayake, Luis Betancourt, Wenqian Xu, Eric Breynaert, Tomislav Frisčić, Robert W. Schurko
New mechanochemical preparations of three multicomponent crystals (MCCs) of the form MCl:urea·xH2O (M = Li, Na and Cs) are reported. Their structures were determined by an NMR crystallography approach, combining Rietveld refinement of synchrotron powder X-ray diffraction data (PXRD), multinuclear (35Cl, 7Li, 23Na and 133Cs) solid-state NMR (SSNMR) spectroscopy and thermal analysis. The mechanochemical syntheses of the three MCCs, two of which are novel, were optimized for maximum yield and efficiency. 35Cl SSNMR is well suited for the structural characterization of these MCCs since it is sensitive to subtle differences and/or changes in chloride ion environments, providing a powerful means of examining H…Cl− bonding environments. Alkali metal NMR is beneficial for identifying the number of unique magnetically and crystallographically distinct sites and enables facile detection of educts and/or impurities. In the case of NaCl:urea·H2O, 23Na magic-angle spinning NMR spectra are key, both for identifying residual NaCl educt and for monitoring NaCl:urea·H2O degradation, which appears to proceed via an autocatalytic decomposition process driven by water (with a rate constant of k = 1.22 × 10−3 s−1). SSNMR and PXRD were used to inform the initial structural models. Following Rietveld refinement, the models were subjected to dispersion-corrected plane-wave density functional theory geometry optimizations and subsequent calculations of the 35Cl electric field gradient tensors, which enable the refinement of hydrogen-atom positions, as well as the exploration of their relationships to the local hydrogen-bonding environments of the chloride ions and crystallographic symmetry elements.
{"title":"Rietveld refinement and NMR crystallographic investigations of multicomponent crystals containing alkali metal chlorides and urea","authors":"Cameron S. Vojvodin, Sean T. Holmes, Christine E. A. Kirschhock, David A. Hirsh, Igor Huskić, Sanjaya Senanayake, Luis Betancourt, Wenqian Xu, Eric Breynaert, Tomislav Frisčić, Robert W. Schurko","doi":"10.1107/S1600576725001360","DOIUrl":"https://doi.org/10.1107/S1600576725001360","url":null,"abstract":"<p>New mechanochemical preparations of three multicomponent crystals (MCCs) of the form <i>M</i>Cl:urea·<i>x</i>H<sub>2</sub>O (<i>M</i> = Li, Na and Cs) are reported. Their structures were determined by an NMR crystallography approach, combining Rietveld refinement of synchrotron powder X-ray diffraction data (PXRD), multinuclear (<sup>35</sup>Cl, <sup>7</sup>Li, <sup>23</sup>Na and <sup>133</sup>Cs) solid-state NMR (SSNMR) spectroscopy and thermal analysis. The mechanochemical syntheses of the three MCCs, two of which are novel, were optimized for maximum yield and efficiency. <sup>35</sup>Cl SSNMR is well suited for the structural characterization of these MCCs since it is sensitive to subtle differences and/or changes in chloride ion environments, providing a powerful means of examining H…Cl<sup>−</sup> bonding environments. Alkali metal NMR is beneficial for identifying the number of unique magnetically and crystallographically distinct sites and enables facile detection of educts and/or impurities. In the case of NaCl:urea·H<sub>2</sub>O, <sup>23</sup>Na magic-angle spinning NMR spectra are key, both for identifying residual NaCl educt and for monitoring NaCl:urea·H<sub>2</sub>O degradation, which appears to proceed <i>via</i> an autocatalytic decomposition process driven by water (with a rate constant of <i>k</i> = 1.22 × 10<sup>−3</sup> s<sup>−1</sup>). SSNMR and PXRD were used to inform the initial structural models. Following Rietveld refinement, the models were subjected to dispersion-corrected plane-wave density functional theory geometry optimizations and subsequent calculations of the <sup>35</sup>Cl electric field gradient tensors, which enable the refinement of hydrogen-atom positions, as well as the exploration of their relationships to the local hydrogen-bonding environments of the chloride ions and crystallographic symmetry elements.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"58 2","pages":"333-348"},"PeriodicalIF":5.2,"publicationDate":"2025-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143741232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-03-19DOI: 10.1107/S1600576725000937
Darshan Chalise, Yifan Wang, Mariano Trigo, Leora E. Dresselhaus-Marais
Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real-space resolution of ∼100 nm and a reciprocal-space resolution of ∼10−4 radians. Recent implementations of DFXM at X-ray free electron lasers have demonstrated DFXM's ability to visualize the real-time evolution of coherent gigahertz phonons produced by ultrafast laser excitation of metal transducers. Combining this with DFXM's ability to visualize strain fields due to dislocations makes it possible to study the interaction of gigahertz coherent phonons with the strain fields of dislocations and damping of coherent phonons due to interactions with thermal phonons. For advanced analysis of phonon–dislocation interactions and phonon damping, a formalism is required to relate phonon dynamics to the strains measured by DFXM. Here, kinematic diffraction theory is used to simulate DFXM images of the specific coherent phonons in diamond that are generated by the ultrafast laser excitation of a metal transducer. This formalism is also extended to describe imaging of incoherent phonons of sufficiently high frequency to be relevant for thermal transport, offering future opportunities for DFXM to image signals produced by thermal diffuse scattering. For both coherent and incoherent phonons, opportunities are discussed for optimized sampling of reciprocal space and time for deterministic measurements through advances in the optics and excitation geometry.
暗场 X 射线显微镜(DFXM)是在同步加速器上开发的一种新型 X 射线成像技术,可沿衍射光束成像,实空间分辨率为 100 纳米,倒空间分辨率为 10-4 弧度。最近在 X 射线自由电子激光器上实施的 DFXM 技术表明,DFXM 能够可视化金属换能器在超快激光激发下产生的相干千兆赫声子的实时演变。结合 DFXM 可视化位错应变场的能力,可以研究千赫兹相干声子与位错应变场的相互作用,以及相干声子与热声子相互作用产生的阻尼。要对声子-位错相互作用和声子阻尼进行高级分析,就需要一种形式主义,将声子动力学与 DFXM 测量的应变联系起来。在此,我们使用运动衍射理论来模拟金刚石中特定相干声子的 DFXM 图像,这些相干声子是由超快激光激发金属换能器产生的。这一形式主义还被扩展用于描述频率足够高的非相干声子的成像,从而与热传输相关,为 DFXM 未来成像热漫散射产生的信号提供了机会。对于相干和非相干声子,讨论了通过光学和激发几何的进步优化确定性测量的倒数空间和时间采样的机会。
{"title":"Formalism to image the dynamics of coherent and incoherent phonons with dark-field X-ray microscopy using kinematic diffraction theory","authors":"Darshan Chalise, Yifan Wang, Mariano Trigo, Leora E. Dresselhaus-Marais","doi":"10.1107/S1600576725000937","DOIUrl":"https://doi.org/10.1107/S1600576725000937","url":null,"abstract":"<p>Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real-space resolution of ∼100 nm and a reciprocal-space resolution of ∼10<sup>−4</sup> radians. Recent implementations of DFXM at X-ray free electron lasers have demonstrated DFXM's ability to visualize the real-time evolution of coherent gigahertz phonons produced by ultrafast laser excitation of metal transducers. Combining this with DFXM's ability to visualize strain fields due to dislocations makes it possible to study the interaction of gigahertz coherent phonons with the strain fields of dislocations and damping of coherent phonons due to interactions with thermal phonons. For advanced analysis of phonon–dislocation interactions and phonon damping, a formalism is required to relate phonon dynamics to the strains measured by DFXM. Here, kinematic diffraction theory is used to simulate DFXM images of the specific coherent phonons in diamond that are generated by the ultrafast laser excitation of a metal transducer. This formalism is also extended to describe imaging of incoherent phonons of sufficiently high frequency to be relevant for thermal transport, offering future opportunities for DFXM to image signals produced by thermal diffuse scattering. For both coherent and incoherent phonons, opportunities are discussed for optimized sampling of reciprocal space and time for deterministic measurements through advances in the optics and excitation geometry.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"58 2","pages":"469-483"},"PeriodicalIF":5.2,"publicationDate":"2025-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143741184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-03-19DOI: 10.1107/S1600576725001669
Mayank Kumar, R. S. Rathore
The Ramachandran steric map of torsion angles (ϕ, ψ) introduced in 1963 has been widely used for protein structure validation and model building. Many developments in the field have made it essential to develop a utility to plot assorted types of maps for the following specific reasons: (i) to investigate different types (Gly, Val/Ile, pre/trans/cis-Pro and general) of 2D and 3D maps, addressing the diverse steric environments and frequency distribution of conformations, (ii) to examine polypeptides containing non-standard residues, (iii) for better visualization and analysis of conformational excursions and transitions in simulation, and (iv) to analyse torsion angles across three rotatable bonds such as preferred backbone-dependent rotamers. The utility RamPlot is accessible online (https://www.ramplot.in) and offline (via GitHub, https://github.com/mayank2801/ramplot and PyPI repository). It serves as a unique tool to draw and interpret a great variety of Ramachandran maps for natural and non-standard residues, which is otherwise unfeasible using existing tools and servers.
{"title":"RamPlot: a webserver to draw 2D, 3D and assorted Ramachandran (ϕ, ψ) maps","authors":"Mayank Kumar, R. S. Rathore","doi":"10.1107/S1600576725001669","DOIUrl":"https://doi.org/10.1107/S1600576725001669","url":null,"abstract":"<p>The Ramachandran steric map of torsion angles (ϕ, ψ) introduced in 1963 has been widely used for protein structure validation and model building. Many developments in the field have made it essential to develop a utility to plot assorted types of maps for the following specific reasons: (i) to investigate different types (Gly, Val/Ile, pre/<i>trans</i>/<i>cis</i>-Pro and general) of 2D and 3D maps, addressing the diverse steric environments and frequency distribution of conformations, (ii) to examine polypeptides containing non-standard residues, (iii) for better visualization and analysis of conformational excursions and transitions in simulation, and (iv) to analyse torsion angles across three rotatable bonds such as preferred backbone-dependent rotamers. The utility <i>RamPlot</i> is accessible online (https://www.ramplot.in) and offline (via GitHub, https://github.com/mayank2801/ramplot and PyPI repository). It serves as a unique tool to draw and interpret a great variety of Ramachandran maps for natural and non-standard residues, which is otherwise unfeasible using existing tools and servers.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"58 2","pages":"630-636"},"PeriodicalIF":5.2,"publicationDate":"2025-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143741185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-03-13DOI: 10.1107/S1600576725000949
Yifan Wang, Nicolas Bertin, Dayeeta Pal, Sara J. Irvine, Kento Katagiri, Robert E. Rudd, Leora E. Dresselhaus-Marais
Dark-field X-ray microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D defect geometries, it is still challenging to interpret DFXM images of the high-dislocation-density systems relevant to macroscopic crystal plasticity. This work develops a scalable forward model to calculate virtual DFXM images for complex discrete dislocation structure(s) (DDS) obtained from atomistic simulations. Our new DDS-DFXM model integrates a non-singular formulation for calculating the local strain from the DDS and an efficient geometrical optics algorithm for computing the DFXM image from the strain field. We apply the model to complex DDS obtained from a large-scale molecular dynamics simulation of compressive loading on single-crystal silicon. Simulated DFXM images exhibit prominent contrast for dislocation features between the multiple slip systems, demonstrating the potential of DFXM to resolve features from dislocation multiplication. The integrated DDS-DFXM model provides a toolbox for DFXM experimental design and image interpretation in the context of bulk crystal plasticity for a range of measurements across shock plasticity and the broader materials science community.
{"title":"Computing virtual dark-field X-ray microscopy images of complex discrete dislocation structures from large-scale molecular dynamics simulations","authors":"Yifan Wang, Nicolas Bertin, Dayeeta Pal, Sara J. Irvine, Kento Katagiri, Robert E. Rudd, Leora E. Dresselhaus-Marais","doi":"10.1107/S1600576725000949","DOIUrl":"https://doi.org/10.1107/S1600576725000949","url":null,"abstract":"<p>Dark-field X-ray microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D defect geometries, it is still challenging to interpret DFXM images of the high-dislocation-density systems relevant to macroscopic crystal plasticity. This work develops a scalable forward model to calculate virtual DFXM images for complex discrete dislocation structure(s) (DDS) obtained from atomistic simulations. Our new DDS-DFXM model integrates a non-singular formulation for calculating the local strain from the DDS and an efficient geometrical optics algorithm for computing the DFXM image from the strain field. We apply the model to complex DDS obtained from a large-scale molecular dynamics simulation of compressive loading on single-crystal silicon. Simulated DFXM images exhibit prominent contrast for dislocation features between the multiple slip systems, demonstrating the potential of DFXM to resolve features from dislocation multiplication. The integrated DDS-DFXM model provides a toolbox for DFXM experimental design and image interpretation in the context of bulk crystal plasticity for a range of measurements across shock plasticity and the broader materials science community.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"58 2","pages":"458-468"},"PeriodicalIF":5.2,"publicationDate":"2025-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143741018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}