Influence of Air Pressure on Laser-Induced Breakdown Spectroscopy of Silicon Rubber Insulators

IF 3.1 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2024-06-19 DOI:10.1109/TDEI.2024.3416431
Qi Wang;Yu Deng;Yongqi He;Xinzhe Yu;Zheyuan Liu;Xilin Wang
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Abstract

Silicon rubber composite insulators are widely used in transmission lines owing to their excellent external insulation. However, the silicone rubber composite insulator gradually ages, seriously affecting its external insulation properties. Traditional silicone rubber composite insulator detection methods (such as ATH content, which affects resistance to tracking and erosion, and usually needs to cut a sample from an insulator) cannot achieve rapid in situ detection, while laser-induced breakdown spectroscopy (LIBS) is a new in situ detection technology, which has the advantages of rapid detection and remote detection, having a good application prospect in the field of electrical engineering. The ultrahigh-voltage (UHV) transmission lines pass through high-altitude areas such as Lhasa in Tibet (3658 m above sea level with 65 kPa air pressure). The low air pressure in high-altitude areas affects the accuracy of LIBS detection. Herein, the influence law and mechanism of air pressure on the laser spectral data and the influence of air pressure on the quantitative analysis ability of LIBS are studied based on LIBS. The results show that in the range of 50–101 kPa air pressure, the spectral line intensity increases as the air pressure decreases. The energy of the laser propagates in the air with a negative exponential attenuation law, the lower the air pressure is, the higher the energy attenuation curve is. The ablative morphology of samples is different under different pressures, under low air pressure, the morphology of the ablation hole is more uniform and the average depth is greater. The quantitative analysis ability of LIBS is different under different pressures, the goodness of fit of the model at 50 kPa is better than that at 101 kPa under a single linear calibration model (Al I 396.15 nm spectral line intensity-ATH content), the goodness of fit is 0.967 and 0.928, respectively, and the full-spectrum data-ATH content calibration model is established by partial least squares (PLSs) at 50 and 101 kPa. Overall, the model goodness of fit is improved to 0.995 and 0.992, respectively. Through this study, we can preliminarily understand the influence law and mechanism of air pressure on laser spectral data, which is conducive to eliminating the influence of air pressure on LIBS quantitative analysis, which is expected to be used for remote online monitoring of transmission lines insulation status.
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气压对硅橡胶绝缘体激光诱导击穿光谱的影响
硅橡胶复合绝缘子因其优异的外绝缘性能而广泛应用于输电线路中。但硅橡胶复合绝缘子逐渐老化,严重影响其外绝缘性能。传统的硅橡胶复合绝缘子检测方法(如ATH含量,影响抗跟踪和侵蚀,通常需要从绝缘子上切割样品)无法实现快速的原位检测,而激光诱导击穿光谱(LIBS)是一种新型的原位检测技术,具有快速检测和远程检测的优点,在电气工程领域具有良好的应用前景。特高压输电线路途经西藏拉萨等高海拔地区(海拔3658米,气压65kpa)。高海拔地区的低气压影响LIBS探测的精度。本文基于LIBS,研究了气压对激光光谱数据的影响规律和机理,以及气压对LIBS定量分析能力的影响。结果表明:在50 ~ 101 kPa气压范围内,谱线强度随气压的减小而增大;激光能量在空气中的传播呈负指数衰减规律,气压越低,能量衰减曲线越高。不同压力下试样的烧蚀形貌不同,低气压下烧蚀孔形貌更均匀,平均深度更大。不同压力下LIBS的定量分析能力不同,在单一线性校准模型(Al I 396.15 nm谱线强度- ath含量)下,50 kPa下模型的拟合优度优于101 kPa下的拟合优度,拟合优度分别为0.967和0.928,采用偏最小二乘法在50和101 kPa下建立全谱数据- ath含量校准模型。总体而言,模型拟合优度分别提高到0.995和0.992。通过本研究,我们可以初步了解气压对激光光谱数据的影响规律和机理,有利于消除气压对LIBS定量分析的影响,有望用于输电线路绝缘状态的远程在线监测。
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
期刊最新文献
IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors Corrections to “On the Frequency Dependence of the PDIV in Twisted Pair Magnet Wire Analogy in Dry Air” IEEE Dielectrics and Electrical Insulation Society Information 2025 Index IEEE Transactions on Dielectrics and Electrical Insulation IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors
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