Soft X-Ray Phase Nanomicroscopy of Micrometer-Thick Magnets

IF 11.6 1区 物理与天体物理 Q1 PHYSICS, MULTIDISCIPLINARY Physical Review X Pub Date : 2024-08-15 DOI:10.1103/physrevx.14.031028
Jeffrey Neethirajan, Benedikt J. Daurer, Marisel Di Pietro Martínez, Aleš Hrabec, Luke Turnbull, Rikako Yamamoto, Marina Raboni Ferreira, Aleš Štefančič, Daniel Alexander Mayoh, Geetha Balakrishnan, Zhaowen Pei, Pengfei Xue, Liao Chang, Emilie Ringe, Richard Harrison, Sergio Valencia, Majid Kazemian, Burkhard Kaulich, Claire Donnelly
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Abstract

Imaging of nanoscale magnetic textures within extended material systems is of critical importance to both fundamental research and technological applications. While high-resolution magnetic imaging of thin nanoscale samples is well established with electron and soft x-ray microscopy, the extension to micrometer-thick systems currently requires hard x rays, which limits high-resolution imaging to rare-earth magnets. Here, we overcome this limitation by establishing soft x-ray magnetic imaging of micrometer-thick systems using the pre-edge phase x-ray magnetic circular dichroism signal, thus making possible the study of a wide range of magnetic materials. By performing dichroic spectroptychography, we demonstrate high spatial resolution imaging of magnetic samples up to 1.7μm thick, an order of magnitude higher than conventionally possible with soft x-ray absorption-based techniques. We demonstrate the applicability of the technique by harnessing the pre-edge phase to image thick chiral helimagnets, and naturally occurring magnetite particles, gaining insight into their three-dimensional magnetic configuration. This new regime of magnetic imaging makes possible the study of extended non-rare-earth systems that have until now been inaccessible, including magnetic textures for future spintronic applications, non-rare-earth permanent magnets for energy harvesting, and the magnetic configuration of giant magnetofossils.

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微米厚磁体的软 X 射线相纳米显微镜
对扩展材料系统中的纳米级磁纹理进行成像对于基础研究和技术应用都至关重要。虽然薄纳米级样品的高分辨率磁成像已通过电子显微镜和软 X 射线显微镜得到证实,但要扩展到微米厚的系统目前还需要硬 X 射线,这就限制了稀土磁体的高分辨率成像。在这里,我们利用前沿相位 X 射线磁性圆二色性信号建立了微米厚系统的软 X 射线磁性成像,从而克服了这一限制,使对各种磁性材料的研究成为可能。通过进行分色光谱分析,我们展示了厚度达 1.7 微米的磁性样品的高空间分辨率成像,比传统的基于软 X 射线吸收的技术高出一个数量级。我们利用前沿相位对厚手性自旋磁体和天然磁铁矿颗粒进行成像,深入了解它们的三维磁性构造,从而证明了该技术的适用性。这种新的磁成像技术使我们有可能研究到目前为止还无法进入的扩展非稀土系统,包括未来自旋电子应用的磁纹理、用于能量收集的非稀土永磁体以及巨型磁化石的磁构型。
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来源期刊
Physical Review X
Physical Review X PHYSICS, MULTIDISCIPLINARY-
CiteScore
24.60
自引率
1.60%
发文量
197
审稿时长
3 months
期刊介绍: Physical Review X (PRX) stands as an exclusively online, fully open-access journal, emphasizing innovation, quality, and enduring impact in the scientific content it disseminates. Devoted to showcasing a curated selection of papers from pure, applied, and interdisciplinary physics, PRX aims to feature work with the potential to shape current and future research while leaving a lasting and profound impact in their respective fields. Encompassing the entire spectrum of physics subject areas, PRX places a special focus on groundbreaking interdisciplinary research with broad-reaching influence.
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