Integrated Active Quenching Circuit for high-rate and distortionless SPAD-based time-resolved fluorescence applications.

Abstract

Time-Correlated Single Photon Counting (TCSPC) is a pivotal technique in low-light-detection applications, renowned for its exceptional sensitivity and bandwidth, widely used in Fluorescence Lifetime Imaging Microscopy (FLIM) and quantum optics. Despite its features, TCSPC is significantly hindered by the pile-up effect, which may distort measurements at high photon-detection rates. Overcoming pile-up is challenging, with traditional solutions often involving complex post-processing or multichannel systems, complicating the TCSPC setup and limiting performance. A breakthrough to overcome this issue is matching the photodetector dead time to an integer multiple of the laser period, obtaining a distortionless histogram even at high illumination conditions. Building on this concept, we present an Active Quenching Circuit (AQC) developed in high-voltage 150 nm technology, achieving unprecedented control over the Single Photon Avalanche Diode (SPAD) dead time. Our design compensates for Process, Voltage, and Temperature (PVT) variations, ensuring ultra precise and robust dead time tuning. The presented AQC achieves a dead-time resolution of 50 ps suitable for time-resolved experiments within a selectable range of laser frequencies from 20 to 100 MHz, maintaining close-to- ideal linearity in dead-time control. Experimental validations through fluorescence measurements reveal a distortion as low as 0.43% under elevated count-rate conditions, highlighting the efficacy of our circuit in overcoming the pile-up limitation.