Review on high spatial resolution dosimetry with pixelated semiconductor detectors for radiation therapy

Abstract

Current and emerging radiation therapy treatment techniques are characterized by complex and spatially non-uniform dose distributions with steep dose gradients delivered through high-precision dose placement with small radiation fields. Such approaches necessitate advanced verification tools. For accurate dose profile representation in stereotactic radiation therapy using megavoltage X-rays, the Nyquist theorem places the minimum sampling step as 2.5 mm that determines the required spatial resolution of the detectors for dose verification. For techniques such as micro- and mini-beam radiotherapy, micron-scale sampling is required, and sub-millimeter for particle therapy. Silicon semiconductor detectors provide the possibility of producing small sensitive volumes (including in arrays) without compromising mechanical robustness or sensitivity, therefore allowing for high spatial resolution dosimetry. They exhibit many properties of an ideal detector, while the properties of silicon detectors known to negatively influence response can be compensated for and minimized. As such, this work reviews the current status of semiconductor radiation detectors providing dose sampling by diodes with submillimeter sensitive volumes and a pitch of 2.5 mm or smaller for relative dosimetry in X-ray and electron external beam radiation therapy, brachytherapy, microbeam radiation therapy, proton, and heavy ion therapy. The following types of devices are discussed in this work, including commercial systems and those under development: one-dimensional and two-dimensional pixelated arrays (monolithic and single diode based).