{"title":"Rethinking Self-Training for Semi-Supervised Landmark Detection: A Selection-Free Approach","authors":"Haibo Jin;Haoxuan Che;Hao Chen","doi":"10.1109/TIP.2024.3451937","DOIUrl":null,"url":null,"abstract":"Self-training is a simple yet effective method for semi-supervised learning, during which pseudo-label selection plays an important role for handling confirmation bias. Despite its popularity, applying self-training to landmark detection faces three problems: 1) The selected confident pseudo-labels often contain data bias, which may hurt model performance; 2) It is not easy to decide a proper threshold for sample selection as the localization task can be sensitive to noisy pseudo-labels; 3) coordinate regression does not output confidence, making selection-based self-training infeasible. To address the above issues, we propose Self-Training for Landmark Detection (STLD), a method that does not require explicit pseudo-label selection. Instead, STLD constructs a task curriculum to deal with confirmation bias, which progressively transitions from more confident to less confident tasks over the rounds of self-training. Pseudo pretraining and shrink regression are two essential components for such a curriculum, where the former is the first task of the curriculum for providing a better model initialization and the latter is further added in the later rounds to directly leverage the pseudo-labels in a coarse-to-fine manner. Experiments on three facial and one medical landmark detection benchmark show that STLD outperforms the existing methods consistently in both semi- and omni-supervised settings. The code is available at \n<uri>https://github.com/jhb86253817/STLD</uri>\n.","PeriodicalId":94032,"journal":{"name":"IEEE transactions on image processing : a publication of the IEEE Signal Processing Society","volume":"33 ","pages":"4952-4965"},"PeriodicalIF":0.0000,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE transactions on image processing : a publication of the IEEE Signal Processing Society","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10667011/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Self-training is a simple yet effective method for semi-supervised learning, during which pseudo-label selection plays an important role for handling confirmation bias. Despite its popularity, applying self-training to landmark detection faces three problems: 1) The selected confident pseudo-labels often contain data bias, which may hurt model performance; 2) It is not easy to decide a proper threshold for sample selection as the localization task can be sensitive to noisy pseudo-labels; 3) coordinate regression does not output confidence, making selection-based self-training infeasible. To address the above issues, we propose Self-Training for Landmark Detection (STLD), a method that does not require explicit pseudo-label selection. Instead, STLD constructs a task curriculum to deal with confirmation bias, which progressively transitions from more confident to less confident tasks over the rounds of self-training. Pseudo pretraining and shrink regression are two essential components for such a curriculum, where the former is the first task of the curriculum for providing a better model initialization and the latter is further added in the later rounds to directly leverage the pseudo-labels in a coarse-to-fine manner. Experiments on three facial and one medical landmark detection benchmark show that STLD outperforms the existing methods consistently in both semi- and omni-supervised settings. The code is available at
https://github.com/jhb86253817/STLD
.