{"title":"A Review of Single-Event Upset-Rate Calculation Methods","authors":"D. L. Hansen;T. Manich;I. Zavatkay","doi":"10.1109/TNS.2024.3451312","DOIUrl":null,"url":null,"abstract":"This article implements rate-calculation methods in the open literature and evaluates each of them by comparing the calculated results to the upset rates observed on-orbit for missions from 1987 to the present-day. Within the radiation effects community, the upset rates are typically calculated to give a worst-case result. Keeping this in mind, the models are optimized to provide the greatest precision while still over-estimating the rate in 90% of the datasets. The results indicate that a number of simple models that approximate the device data and environment do a good job in calculating the upset rate. Further, more complicated methods are not necessarily better and produce calculations with wider error bars and be more likely to underestimate the rate. In all cases, the implementation of the model is as important as the models used.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1021-1030"},"PeriodicalIF":1.9000,"publicationDate":"2024-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nuclear Science","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10654525/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article implements rate-calculation methods in the open literature and evaluates each of them by comparing the calculated results to the upset rates observed on-orbit for missions from 1987 to the present-day. Within the radiation effects community, the upset rates are typically calculated to give a worst-case result. Keeping this in mind, the models are optimized to provide the greatest precision while still over-estimating the rate in 90% of the datasets. The results indicate that a number of simple models that approximate the device data and environment do a good job in calculating the upset rate. Further, more complicated methods are not necessarily better and produce calculations with wider error bars and be more likely to underestimate the rate. In all cases, the implementation of the model is as important as the models used.
期刊介绍:
The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years.
The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.