Eul-Yong Shin, Yeongseop Lee, Ho Young Kim, So Hyun Park, Yongseok Jun, Jin Young Kim, Hae Jung Son
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Abstract
Mitigating ultraviolet exposure-induced photodegradation remains a critical challenge to the long-term stability of organic photovoltaics (OPVs). Here, we improved the stability of the OPV device by introducing an antioxidant interlayer composed of nanocrystalline ceria supported on mesoporous silica nanoparticles (CeOx-MSN). The CeOx nanocrystals within the CeOx-MSN exhibited a high density of oxygen vacancies and a large ratio of Ce(III) chemical states known to scavenge reactive oxygen species. Optimizing the particle size of the CeOx nanocrystals further enhanced the ratio of Ce(III) states, enabling superior radical scavenging efficacy in methyl violet degradation tests compared with commercial CeOx nanostructures. The OPV performance test confirmed that the optimized CeOx-MSN (CeOx-MSN_S) can scavenge radicals without a degradation in initial performance under one-sun illumination. More importantly, the photostability test revealed that the OPV device with CeOx-MSN_S retained 73% of initial performance while the conventional device retained only 54%, corroborating the excellent radical scavenging efficacy of CeOx-MSN_S.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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