Head Smear Reduction in Head-Disk Interface of HAMR Using External AC Electric Field

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Magnetics Pub Date : 2024-09-02 DOI:10.1109/TMAG.2024.3452784
Hiroshi Tani;Yuto Miyuki;Shohei Kawada;Renguo Lu;Shinji Koganezawa
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Abstract

Head smear in a head-disk interface (HDI) of the heat-assisted magnetic recording disturbs the head flyability. This study focused on the effect of an external ac electric field on reducing head smears. The smear amount from the disks with lubricant films under an ac electric field and laser heating was evaluated. The smear amount decreased when an electric field was applied between the disk and pin. This is because the ions that desorb from the disk surface get trapped in the space between the disk and pin surfaces and do not reach the pin surface because of the ac electric field.
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利用外部交流电场减少 HAMR 头盘界面的磁头斑点
在热辅助磁记录的磁头磁盘接口(HDI)中,磁头污迹会干扰磁头的飞行性能。本研究的重点是外部交流电场对减少头部污迹的影响。在交流电场和激光加热作用下,对涂有润滑膜的圆盘的涂抹量进行了评价。当在盘和引脚之间施加电场时,涂抹量减少。这是因为从磁盘表面解吸的离子被困在磁盘和引脚表面之间的空间中,由于交流电场而无法到达引脚表面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Transactions on Magnetics
IEEE Transactions on Magnetics 工程技术-工程:电子与电气
CiteScore
4.00
自引率
14.30%
发文量
565
审稿时长
4.1 months
期刊介绍: Science and technology related to the basic physics and engineering of magnetism, magnetic materials, applied magnetics, magnetic devices, and magnetic data storage. The IEEE Transactions on Magnetics publishes scholarly articles of archival value as well as tutorial expositions and critical reviews of classical subjects and topics of current interest.
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