High-quality hexagonal boron nitride selectively grown on patterned epigraphene by MOVPE

Vishnu Ottapilakkal, Abhishek Juyal, Suresh Sundaram, Phuong Vuong, Collin Beck, Noel L. Dudeck, Amira Bencherif, Annick Loiseau, Frédéric Fossard, Jean-Sebastien Mérot, David Chapron, Thomas H. Kauffmann, Jean-Paul Salvestrini, Paul L. Voss, Walt A. de Heer, Claire Berger, Abdallah Ougazzaden
{"title":"High-quality hexagonal boron nitride selectively grown on patterned epigraphene by MOVPE","authors":"Vishnu Ottapilakkal, Abhishek Juyal, Suresh Sundaram, Phuong Vuong, Collin Beck, Noel L. Dudeck, Amira Bencherif, Annick Loiseau, Frédéric Fossard, Jean-Sebastien Mérot, David Chapron, Thomas H. Kauffmann, Jean-Paul Salvestrini, Paul L. Voss, Walt A. de Heer, Claire Berger, Abdallah Ougazzaden","doi":"arxiv-2409.04709","DOIUrl":null,"url":null,"abstract":"Hexagonal boron nitride encapsulation is the method of choice for protecting\ngraphene from environmental doping and impurity scattering. It was previously\ndemonstrated that metal-organic vapor phase epitaxy (MOVPE) grows epitaxially\nordered, uniform BN layers on epigraphene (graphene grown on SiC). Due to\ngraphene non-wetting properties, h-BN growth starts preferentially from the\ngraphene ledges. We use this fact here to selectively promote growth of\nhigh-quality flat h-BN on epigraphene by patterning epigraphene microstructures\nprior to BN growth. Thin h-BN films (down to 6 nm) grown by MOVPE show smooth\nand pleated surface morphology on epigraphene, while crumpled BN is observed on\nthe SiC. Cross-sectional high-resolution transmission electron microscopy\nimages and fluorescence imaging confirm the higher BN quality grown on the\nepigraphene. Transport measurements reveal p-doping as expected from hydrogen\nintercalation of epigraphene and regions of high and low mobility. This method\ncan be used to produce structurally uniform high-quality h-BN/epigraphene\nmicro/nano scale heterostructure.","PeriodicalId":501137,"journal":{"name":"arXiv - PHYS - Mesoscale and Nanoscale Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Mesoscale and Nanoscale Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.04709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Hexagonal boron nitride encapsulation is the method of choice for protecting graphene from environmental doping and impurity scattering. It was previously demonstrated that metal-organic vapor phase epitaxy (MOVPE) grows epitaxially ordered, uniform BN layers on epigraphene (graphene grown on SiC). Due to graphene non-wetting properties, h-BN growth starts preferentially from the graphene ledges. We use this fact here to selectively promote growth of high-quality flat h-BN on epigraphene by patterning epigraphene microstructures prior to BN growth. Thin h-BN films (down to 6 nm) grown by MOVPE show smooth and pleated surface morphology on epigraphene, while crumpled BN is observed on the SiC. Cross-sectional high-resolution transmission electron microscopy images and fluorescence imaging confirm the higher BN quality grown on the epigraphene. Transport measurements reveal p-doping as expected from hydrogen intercalation of epigraphene and regions of high and low mobility. This method can be used to produce structurally uniform high-quality h-BN/epigraphene micro/nano scale heterostructure.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
通过 MOVPE 技术在图案化的石墨烯上选择性生长高质量六方氮化硼
六方氮化硼封装是保护石墨烯免受环境掺杂和杂质散射影响的首选方法。以前的研究表明,金属有机气相外延(MOVPE)可以在石墨烯(生长在碳化硅上的石墨烯)上生长出外延有序、均匀的氮化硼层。由于石墨烯的非润湿特性,h-BN 的生长优先从石墨烯的边缘开始。我们在此利用这一事实,通过在 BN 生长之前对石墨烯微观结构进行图案化,有选择性地促进了高质量平面 h-BN 在石墨烯上的生长。通过 MOVPE 技术生长的 h-BN 薄膜(小至 6 nm)在表石墨烯上显示出光滑和褶皱的表面形态,而在碳化硅上则观察到了皱巴巴的 BN。横截面高分辨率透射电子显微镜图像和荧光成像证实了在表石墨烯上生长的 BN 质量更高。传输测量结果显示,表石墨烯的氢掺杂产生了预期的 p 掺杂以及高和低迁移率区域。这种方法可用于制备结构均匀的高质量 h-BN/表石墨烯微/纳米级异质结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Light-induced Nonlinear Resonant Spin Magnetization Borophane as substrate for adsorption of He-4: A journey across dimensionality Memory resistor based in GaAs 2D-bilayers: In and out of equilibrium Three-dimensional valley-contrasting sound How does Goldene Stack?
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1