{"title":"Monitoring bivariate zero-inflated Poisson processes: an alternative to copula-based bivariate attribute control chart","authors":"Surajit Pal, Susanta Kumar Gauri","doi":"10.1080/03610918.2024.2389931","DOIUrl":null,"url":null,"abstract":"Occurrences of two (or more) types of defects are not uncommon in high quality (or zero-inflated) processes. Bivariate (or multivariate) attribute control charts are required to be developed for mo...","PeriodicalId":55240,"journal":{"name":"Communications in Statistics-Simulation and Computation","volume":"58 1","pages":""},"PeriodicalIF":0.8000,"publicationDate":"2024-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Communications in Statistics-Simulation and Computation","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1080/03610918.2024.2389931","RegionNum":4,"RegionCategory":"数学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"STATISTICS & PROBABILITY","Score":null,"Total":0}
引用次数: 0
Abstract
Occurrences of two (or more) types of defects are not uncommon in high quality (or zero-inflated) processes. Bivariate (or multivariate) attribute control charts are required to be developed for mo...
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