{"title":"Investigation of Breakdown Phenomenon and Long-Pulse Improvement in Ku-Band TTO","authors":"Weili Xu;Junpu Ling;Juntao He;XinBing Cheng;Rong Chen;Lili Song;Lei Wang;Xingfu Gao;Zulong Chen","doi":"10.1109/TED.2024.3441562","DOIUrl":null,"url":null,"abstract":"This study is an experimental investigation aimed at addressing the limitation of pulsewidth in traditional \n<italic>Ku</i>\n-band transit-time oscillator (TTO) devices within a long-pulse accelerator as highlighted in a previous study. By controlling the number of shots and analyzing the variations in breakdown phenomena within the device, we identified the junction between the extraction cavity and drift section as a susceptible area for breakdown discharges. Through an increase in the number of shots, we confirmed the validity of the “anode plasma impact” model. Building upon adjustments made to the internal structure of the drift section, we successfully optimized the output pulsewidth of the TTO device from 68 to 82 ns, effectively maximizing the energy efficiency of the pulse. This research holds significant implications for the design optimization of devices in long-pulse accelerators.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":null,"pages":null},"PeriodicalIF":2.9000,"publicationDate":"2024-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10648933/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This study is an experimental investigation aimed at addressing the limitation of pulsewidth in traditional
Ku
-band transit-time oscillator (TTO) devices within a long-pulse accelerator as highlighted in a previous study. By controlling the number of shots and analyzing the variations in breakdown phenomena within the device, we identified the junction between the extraction cavity and drift section as a susceptible area for breakdown discharges. Through an increase in the number of shots, we confirmed the validity of the “anode plasma impact” model. Building upon adjustments made to the internal structure of the drift section, we successfully optimized the output pulsewidth of the TTO device from 68 to 82 ns, effectively maximizing the energy efficiency of the pulse. This research holds significant implications for the design optimization of devices in long-pulse accelerators.
期刊介绍：
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
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