Saturation degree in dopant monolayers as modulator of Al-doping of ZnO by the Atomic Layer Deposition-supercycle approach

IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Thin Solid Films Pub Date : 2024-09-12 DOI:10.1016/j.tsf.2024.140532
Dalia Alejandra Mazón-Montijo , Axel Agustín Ortiz-Atondo , Gerdany Zúñiga-Verdugo , Dagoberto Cabrera-German , Obed Yamín Ramírez-Esquivel , Zeuz Montiel-González
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Abstract

Transparent conductive oxides are trending topic in science and technology due to counterintuitive properties: optical transparency and high electrical conductivity. ZnO is a promising example with optoelectronic properties enhanced by supervalent doping. Al-doped ZnO (AZO) has emerged as leading candidate to replace environmentally hazardous In-doped SnO2. However, an ongoing debate exists regarding whether Al-doping improves its optoelectronic properties by substitutional doping or by promoting active defects. Here, we focused on Al-doping of ZnO by atomic layer deposition (ALD) applying the supercycle approach, showing that, decreasing Zn precursor dosing during dopant cycles, the decreasing saturation degree of Zn-species monolayers leads to morphological and microstructural changes that negatively impact optoelectronic properties, whereas Al content remains invariant. Our results demonstrate that unsaturated surfaces after decreasing Zn precursor dosing play a crucial role in Al incorporation, suggesting that, to maximize the effect of doping, complete oxide substitution reactions rather than those of conventional ALD must control growth, while crystallinity must remain. These findings could impact strategy designing for optimization of optoelectronic properties of AZO films deposited by ALD by inclining the debate towards the hypothesis that electrical properties are determined by Al substitutional doping together with active defects formed due to substitutional doping itself.

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通过原子层沉积--超循环方法将掺杂剂单层的饱和度作为氧化锌中铝掺杂的调制剂
透明导电氧化物具有与直觉相反的特性:光学透明性和高导电性,因此是科学和技术领域的热门话题。氧化锌就是一个很有前途的例子,它的光电特性通过掺杂上价元素而得到增强。铝掺杂氧化锌(AZO)已成为替代对环境有害的铟掺杂二氧化锡的主要候选材料。然而,关于铝掺杂是通过置换掺杂还是通过促进活性缺陷来改善其光电特性的争论一直存在。在此,我们采用超循环方法,通过原子层沉积(ALD)对氧化锌进行了铝掺杂,结果表明,在掺杂循环过程中,随着锌前驱体剂量的减少,锌种单层饱和度的降低会导致形态和微观结构的变化,从而对光电特性产生负面影响,而铝含量则保持不变。我们的研究结果表明,减少锌前驱体剂量后的不饱和表面对铝的掺入起着至关重要的作用,这表明要最大限度地发挥掺杂效果,必须用完全的氧化物取代反应而不是传统的 ALD 反应来控制生长,同时必须保持结晶度。这些发现可能会影响优化 ALD 沉积的 AZO 薄膜光电特性的策略设计,使人们倾向于这样一种假设:电特性是由铝替代掺杂和替代掺杂本身形成的活性缺陷共同决定的。
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来源期刊
Thin Solid Films
Thin Solid Films 工程技术-材料科学:膜
CiteScore
4.00
自引率
4.80%
发文量
381
审稿时长
7.5 months
期刊介绍: Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.
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