Nanoscale photoemission in a plasmon focusing lens with a nanohole explored by time-of-flight photoemission electron microscopy

Abstract

Propagating surface plasmon polaritons (SPPs) provide an important platform for the design of various photoelectric devices such as nanometer-scale ultrafast electron sources. Here, a high-brightness nanoscale photoelectron source in a plasmon focusing lens with a nanohole is investigated using time-of-flight photoemission electron microscopy (TOF-PEEM). By exploiting the high spatial resolution of TOF-PEEM, it is found that the photoemission was localized at the nanoscale in both x and y directions. In addition, a large multiphoton photoemission enhancement was achieved and a strong-field effect was observed due to the interplay between the SPP and the nanohole. This paper provides a new idea for the development of the high-brightness nanoscale photoelectron sources and a deep understanding of the interplay between SPP and LSP.